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ISO7641FCDWR Datasheet(PDF) 22 Page - Texas Instruments

Part # ISO7641FCDWR
Description  ISO76x1 Low-Power Triple and Quad-Channels Digital Isolators
PDF  37 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

ISO7641FCDWR Datasheet(HTML) 22 Page - Texas Instruments

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Ambient Temperature - (qC)
0
50
100
150
200
0
100
200
300
400
500
600
700
D001
D001
VCC1 = VCC2 = 2.7 V
VCC1 = VCC2 = 3.6 V
VCC1 = VCC2 = 5.5 V
22
ISO7631FM, ISO7631FC, ISO7641FC
SLLSEC3F – SEPTEMBER 2012 – REVISED APRIL 2016
www.ti.com
Product Folder Links: ISO7631FM ISO7631FC ISO7641FC
Submit Documentation Feedback
Copyright © 2012–2016, Texas Instruments Incorporated
9.3.1.1 Safety Limiting Values
Safety limiting intends to prevent potential damage to the isolation barrier upon failure of input or output circuitry.
A failure of the IO can allow low resistance to ground or the supply and, without current limiting, dissipate
sufficient power to overheat the die and damage the isolation barrier potentially leading to secondary system
failures.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
IS
Safety input, output, or supply
current
DW-16
θJA = 77.5 °C/W, VI = 5.5V, TJ = 150°C, TA = 25°C
293
mA
θJA = 77.5 °C/W, VI = 3.6V, TJ = 150°C, TA = 25°C
448
θJA = 77.5 °C/W, VI = 2.7V, TJ = 150°C, TA = 25°C
597
TS
Maximum safety temperature
150
°C
The safety-limiting constraint is the absolute maximum junction temperature specified in the absolute maximum
ratings table. The power dissipation and junction-to-air thermal impedance of the device installed in the
application hardware determines the junction temperature. The assumed junction-to-air thermal resistance in the
Thermal Information table is that of a device installed on a High-K Test Board for Leaded Surface Mount
Packages. The power is the recommended maximum input voltage times the current. The junction temperature is
then the ambient temperature plus the power times the junction-to-air thermal resistance.
Figure 22. Thermal Derating Curve for Safety Limiting Current per VDE



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