using:

Exceeding the maximum allowable power dissipation will cause excessive die temperature, and the regulator

LP2960

SNVS112C – APRIL 1999 – REVISED APRIL 2013

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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

Absolute Maximum Ratings

(1)

Storage Temperature Range

−65°C to +150°C

Operating Junction Temperature Range

LP2960AI/LP2960I

−40°C to +125°C

Lead Temperature (Soldering, 5 sec.)

260°C

Power Dissipation(2)

Internally Limited

Input Supply Voltage

−20V to +30V

Feedback Input Voltage(3)

−0.3V to +5V

Comparator Input Voltage(4)

−0.3V to +30V

Comparator Output Voltage(4)

−0.3V to +30V

ESD Rating(5)

1.5 kV

(1)

Absolute maximum ratings indicate limits beyond which damage to the component may occur. Electrical specifications do not apply

when operating the device outside of its rated operating conditions.

(2)

The maximum allowable power dissipation is a function of the maximum junction temperature, TJ (max), the junction-to-ambient thermal

resistance,

θJ−A, and the ambient temperature, TA. The maximum allowable power dissipation at any ambient temperature is calculated

will go into thermal shutdown. See Application Hints for additional information on heatsinking and thermal resistance.

(3)

When used in dual-supply systems where the regulator load is returned to a negative supply, the output voltage must be diode-clamped

to ground.

(4)

May exceed the input supply voltage.

(5)

Human Body Model, 200 pF discharged through 1.5 k

Ω.

Electrical Characteristics

Limits in standard typeface are for TJ = 25°C, and limits in boldface type apply over the full operating temperature range.

Unless otherwise specified: CIN = 4.7 μF, VIN = VO(NOM) + 1V, IL = 1 mA, COUT = 10 μF for 5V parts or COUT = 22 μF for 3.3V

parts, Feedback pin is tied to VTAP pin, Output pin is tied to Sense pin, VS/D = 2V.

LP2960AI(1)

LP2960I(1)

Symbol

Parameter

Conditions

Typ

Units

Min

Max

Min

Max

VO

Output Voltage

4.962

5.038

4.925

5.075

1 mA

≤ IL ≤ 500 mA

5.0

(5V Versions)

4.930

5.070

4.880

5.120

V

Output Voltage

3.275

3.325

3.250

3.350

1 mA

≤ IL ≤ 500 mA

3.3

(3.3 Versions)

3.254

3.346

3.221

3.379

Output Voltage

See(2)

20

130

160

ppm/°C

Temperature Coefficient

Output Voltage

0.2

0.4

VIN = [VO(NOM) + 1V] to 30V

0.06

%

Line Regulation

0.5

0.8

Output Voltage

0.16

0.20

See(3)

0.08

%

Load Regulation

0.30

0.40

(1)

All room temperature limits are 100% production tested. All limits at temperature extremes are ensured via correlation using standard

Statistical Quality Control (SQC) methods. All limits are used to calculate Average Outgoing Quality Level.

(2)

Output or reference voltage temperature coefficient is defined as the worst case voltage change divided by the total temperature range.

(3)

Output voltage load regulation is measured at constant junction temperature using low duty cycle pulse testing. Two separate tests are

performed, one for the load current range of 100

μA to 1 mA and one for the 1 mA to 500 mA range. Changes in output voltage due to

heating effects are covered by the thermal regulation specification.

2

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