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ISO7840 Datasheet(PDF) 17 Page - Texas Instruments |
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ISO7840 Datasheet(HTML) 17 Page - Texas Instruments |
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17 / 37 page ![]() V O OUT IN IN = 0V (Devices without suffix F) IN = V (Devices with suffix F) CC See Note A C L V I 0V t fs fs high V O V I 2.7V 50% V CC V CC V OL V OH fs low A. CL = 15pF and includes instrumentation and fixture capacitance within ±20%. Figure 6-3. Default Output Delay Time Test Circuit and Voltage Waveforms IN OUT EN VCCO CL See Note A S1 GNDO GNDI + – VCM + – VOH or VOL C = 0.1µF ±1% C = 0.1µF ±1% VCCI Pass-fail criteria: The output must remain stable. A. CL = 15pF and includes instrumentation and fixture capacitance within ±20%. Figure 6-4. Common-Mode Transient Immunity Test Circuit www.ti.com ISO7840, ISO7840F SLLSEN2C – JULY 2015 – REVISED JULY 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 17 Product Folder Links: ISO7840 ISO7840F |
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