Device overview

HCF4070

6/12

DocID002061 Rev 5

Figure 4. Test circuit

1. CL = 50 pF or equivalent (includes jig and probe capacitance)

2. RL = 200 k

3. RT = ZOUT of pulse generator (typically 50 )

Table 7. Dynamic electrical characteristics

(Tamb = 25 °C, CL = 50 pF, RL = 200 kΩ, tr = tf = 20 ns)

Symbol

Parameter

Test condition

Value(1)

1. Typical temperature coefficient for all VDD values is 0.3%/°C.

Unit

VDD (V)

Min.

Typ.

Max.

tPLH tPHL

Propagation delay time

5

140

280

ns

10

70

130

15

50

100

tTLH tTHL

Output transition time

5

100

200

ns

10

50

100

15

40

80