NE555 datasheet(2/3 Pages) ESTEK

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NE555

Absolute Maximum Ratings

(TA=25°C, unless otherwise specified)

Parameter

Min

Max

Units

Supply Voltage, VCC

4.5

Input Voltage (control, reset, threshold and trigger)

VCC

Output Current, I0

±200

Operating Free-Air Temperature, TA

Storage Temperature Range, TSTG

-65

+150

°C

Electrical characteristics

(TA=25°C, VCC=+5V to +15V, unless otherwise specified)

Parameter

Test conditions (Note 2)

Min

Typ

Max

Units

Operating Supply Voltage Range

4.5

Threshold Voltage Level

VCC=15V

8.8

11.2

VCC=5V

2.4

3.3

4.2

Threshold Current (Note 1)

(see Note 1)

250

Trigger Voltage Level

VCC=15V

4.5

5.6

VCC=5V

1.1

1.67

2.2

Trigger Current

Trigger at 0V

0.5

µA

Reset Voltage Level

0.3

0.7

Reset Current

Reset at VCC

0.1

0.4

Reset at 0V

-0.4

-1.5

Discharge Leakage Current

100

Control Voltage Level

VCC=15V

VCC=5V

2.6

3.3

Low-level Output Voltage

VCC=15V

IOL=10mA

0.1

0.25

IOL=50mA

0.4

0.75

IOL=100mA

2.5

IOL=200mA

2.5

VCC=5V

IOL=5mA

0.25

0.35

IOL=8mA

0.3

0.4

High-level Output Voltage

VCC=15V

IOL=-100mA

12.75

13.3

IOL=-200mA

12.5

VCC=5V

IOL=-100mA

2.75

3.3

Supply Current

Output Low,

VCC=15V

No Load

VCC=5V

Output High,

VCC=15V

No Load

VCC=5V

Initial Error of

Timing Interval (Note 3)

monostable

(Note 4)

astable

(Note 5)

TA=25°C

Temperature Coefficient

monostable

TA=MIN to MAX

150

ppm /°C

of Timing Interval

astable

150

500

Supply Voltage Sensitivity of

monostable

TA=25°C

0.1

0.5

%/V

Timing Interval

astable

0.3

Output Pulse Rise Time

CL=15pF, TA=25°C

100

300

Output Pulse Fall Time

100

300

Note 1: This parameter influences the maximum value of the timing resistors RA and RB in the circuit on Fig 1. For example, when

VCC=5V, the maximum value is R=RA+RB=3.4 MΩ, and VCC=15V, the maximum value is 10 MΩ.

Note 2: For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.

Note 3: Timing interval error is defined as the difference between the measured value and the average value of a random sample from

each process run.

Note 4: Values specified are for a device in a monostable circuit similar to Fig. 2, with component values as follow: RA=2KΩ to 100 KΩ,

C=0.1µF.

Note 5: Values specified are for a device in an astable circuit similar to Fig. 1, with component values as follow: RA, RB=1KΩ to 100 KΩ,

C=0.1µF.

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