28F320C3 datasheet(49/68 Pages) INTEL

Part #	28F320C3

Description	Advanced Boot Block Flash Memory (C3)

PDF	68 Pages

Scroll/Zoom	100%

Manufacturer	INTEL [Intel Corporation]

Direct Link	http://www.intel.com

Logo

49 / 68 page

Intel£ Advanced+ Boot Block Flash Memory (C3)

Datasheet

8.5

AC I/O Test Conditions

NOTE:

Input timing begins, and output timing ends, at VCCQ/2. Input rise and fall times (10% to 90%) < 5 ns.

Worst case speed conditions are when VCC =VCCMin.

NOTE:

See Table 17 for component values.

8.6

Device Capacitance

TA =25 °C, f= 1MHz

Figure 11. AC Input/Output Reference Waveform

CCQ

CCQ/2

Test Points

Input

Output

Figure 12. Transient Equivalent Testing Load Circuit

Device

Under Test

CCQ

Out

Table 23. Test Configuration Component Values for Worst Case Speed Conditions

Test Configuration

CL (pF)

R1 (kΩ)R2 (kΩ)

VCCQMin Standard Test

NOTE:

CL includes jig capacitance.

Symbol

Parameter§

Typ

Max

Unit

Condition

CIN

Input Capacitance

VIN =0.0 V

COUT

Output Capacitance

VOUT =0.0 V

§Sampled, not 100% tested.

28F320C3 Datasheet(PDF) 49 Page - Intel Corporation

28F320C3 Datasheet(HTML) 49 Page - Intel Corporation

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68

Datasheet Download

Link URL