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LCP1521 Datasheet(PDF) 5 Page - STMicroelectronics |
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LCP1521 Datasheet(HTML) 5 Page - STMicroelectronics |
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5 / 9 page ![]() Pulse ( µs) Vp C1 C2 LR1 R2 R3 R4 IPP Rp tr tp (V) ( µF) (nF) ( µH) ( Ω)(Ω)(Ω)(Ω)(A) ( Ω) 10 700 1500 20 200 0 50 15 25 25 30 10 1.2 50 1500 1 33 0 76 13 25 25 30 10 2 10 2500 10 0 1.1 1.3 0 3 3 38 62 This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit. TEST PROCEDURE : - Adjust the current level at the IH value by short circuiting the D.U.T. - Fire the D.U.T. with a surge current : IPP = 10A, 10/1000 µs. - The D.U.T. will come back to the off-state within a duration of 50ms max. R -VP V BAT - 100 V = Surge generator D.U.T. FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT : GO-NO GO TEST CC R R TIP RING GND VP 4 3 2 R 2 R1 (V is defined in unload condition) P L 1 TEST CIRCUIT FOR VFP AND VDGL PARAMETERS LCP1521 5/9 |
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