REF54 datasheet(19/44 Pages) TI2

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7 Parameter Measurement Information

7.1 Temperature Drift

The REF54 is designed and tested for a minimal output voltage temperature drift, which is defined as the change

in output voltage over temperature. Every unit shipped is tested at multiple temperatures to make sure that the

product meets data sheet specifications. The temperature coefficient is calculated using the box method in which

a box is formed by the min/max limits for the nominal output voltage over the operating temperature range.

REF54 device C variant has maximum temperature coefficient of 0.8ppm/°C from 0°C to 70°C and REF54

device Q variant has maximum temperature coefficient of 1.5ppm/°C from -40°C to 125°C. The box method

specifies limits for the temperature error but does not specify the exact shape and slope of the device under

test. Due to temperature curvature correction to achieve low-temperature drift, the temperature drift is expected

to be non-linear. See the Analog Design Journal Precision Voltage References for more information on the box

method. The box method equation is shown in Equation 1:

Drift= VREFMAX −VREFMIN

VREF25℃ ×TemperatureRange ×106

(1)

Te mperature (

C)

-100

-60

-20

100

Figure 7-1. Output Voltage vs Free-Air Temperature

7.2 Long-Term Stability

Long-term stability is a key performance parameter for series voltage references in all precision applications.

This is defined as variation of reference voltage over time. The long-term stability value is tested in a typical

setup that reflects standard PCB board manufacturing practices. The boards are made of standard FR4 material,

the board does not have special cuts or grooves around the devices or go through burn-in process to relieve the

mechanical stress of the PCB. These conditions reflect real world use case scenario and common manufacturing

techniques.

During the long-term stability testing, precautions are taken to make sure that only the long-term stability drift is

being measured. The boards are maintained at 35°C ± 0.02°C in an oil bath. The oil bath makes sure that the

temperature is constant across the device over time. The measurements are captured every 30 minutes with a

calibrated 8.5 digit multimeter.

Typical long term stability characteristic are expressed as reference voltage deviation over time. Figure 7-2

shows the typical drift value for the REF54 in SOIC package VREF is 25ppm from 0 to 1000 hours. Figure 7-4

shows the typical drift value for the REF54 in FKH package VREF is 3ppm from 0 to 1000 hours. The REF54

experiences the highest drift in the initial 1000hr, subsequent deviation is typically lower than previous 1000

hours.

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REF54

SNVSCN7D – NOVEMBER 2023 – REVISED JUNE 2026

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