GH CSSRML.24

DATASHEET

DATASHEET

19 | Version 1.1 | 2025-08-06

Glossary

1)

Brightness: Brightness values are measured during a current pulse of typically 10 ms, with a tolerance

of +/- 7%.

2)

Reverse Operation: Not designed for reverse operation. Continuous reverse operation can cause mi-

gration and damage of the device.

3)

Wavelength: The wavelength is measured at a current pulse of typically 10 ms, with a tolerance of ±

0.5 nm.

4)

Forward Voltage: The Forward voltage is measured during a current pulse duration of typically 1 ms

with a tolerance of ± 0.05V .

5)

Typical Values: Due to the special conditions of the manufacturing processes of semiconductor devic-

es, the typical data or calculated correlations of technical parameters can only reflect statistical figures.

These do not necessarily correspond to the actual parameters of each single product, which could dif-

fer from the typical data and calculated correlations or the typical characteristic line. If requested, e.g.

because of technical improvements, these typ. data will be changed without any further notice.

6)

Characteristic curve: In the range where the line of the graph is broken, you must expect higher differ-

ences between single devices within one packing unit.

7)

Thermal Resistance: Rth max is based on statistic values (6σ) used for Derating.

8)

Tolerance of Measure: Unless otherwise noted in drawing, tolerances are specified with ±0.1 and

dimensions are specified in mm.

9)

Tape and Reel: All dimensions and tolerances are specified acc. IEC 60286-3 and specified in mm.