74AHC_AHCT1G32

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Product data sheet

Rev. 8 — 18 November 2014

7 of 13

NXP Semiconductors

74AHC1G32; 74AHCT1G32

2-input OR gate

Test data is given in Table 8.

Definitions for test circuit:

CL = Load capacitance including jig and probe capacitance.

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

Fig 6.

Test circuit for measuring switching times