74HC_HCT273

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Product data sheet

Rev. 5 — 26 February 2016

12 of 20

NXP Semiconductors

74HC273; 74HCT273

Octal D-type flip-flop with reset; positive-edge trigger

Test data is given in Table 9.

Definitions for test circuit:

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

CL = Load capacitance including jig and probe capacitance.

RL = Load resistance.

S1 = Test selection switch

Fig 10. Test circuit for measuring switching times

Table 9.

Test data

Type

Input

Load

S1 position

VI

tr, tf

CL

RL

tPHL, tPLH

74HC273

VCC

6ns

15pF, 50 pF

1k



open

74HCT273

3V

6ns

15pF, 50 pF

1k



open