74HC_HCT30

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Product data sheet

Rev. 6 — 27 December 2012

8 of 16

NXP Semiconductors

74HC30; 74HCT30

8-input NAND gate

Test data is given in Table 9.

Definitions for test circuit:

RT = termination resistance should be equal to the output impedance Zo of the pulse generator.

CL = load capacitance including jig and probe capacitance.

Fig 6.

Test circuit for measuring switching times

001aah768

tW

tW

tr

tr

tf

VM

VI

negative

pulse

GND

VI

positive

pulse

GND

10 %

90 %

90 %

10 %

VM

VM

VM

tf

VCC

DUT

RT

VI

VO

CL

G

Table 9.

Test data

Type

Input

Load

Test

VI

tr, tf

CL

74HC30

VCC

6.0 ns

15 pF, 50 pF

tPLH, tPHL

74HCT30

3.0 V

6.0 ns

15 pF, 50 pF

tPLH, tPHL