AD1884A datasheet(8/20 Pages) AD

8 / 20 page

Rev. 0

Page 8 of 20

March 2008

AD1884A

ABSOLUTE MAXIMUM RATINGS

Stresses greater than those listed below may cause permanent

damage to the device. This is a stress rating only; functional

operation of the device at these or any other conditions above

those indicated in the operational section of this specification is

not implied. Exposure to absolute maximum rating conditions

for extended periods may affect device reliability.

ESD CAUTION

ENVIRONMENTAL CONDITIONS

Ambient Temperature Rating:

TAMB = TCASE – (PD × θCA)

TCASE = case temperature in °C

PD = power dissipation in W

CA = thermal resistance (case-to-ambient)

JA = thermal resistance (junction-to-ambient)

JC = thermal resistance (junction-to-case)

All measurements per EIA-JESD51 with 2S2P test board per

EIA-JESD51-7.

Parameter

Rating

Digital (DVDD)

–0.30 V to +3.65 V

Digital (DVCORE)

–0.30 V to +2.10 V

Digital I/O (DVIO)

–0.30 V to +3.65 V

Analog (AVDD)

–0.30 V to +3.65 V

Input Current (Except Supply Pins) ±10.0 mA

Analog Input Voltage (Signal Pins)

–0.30 V to AVDD +0.3 V

Digital Input Voltage (Signal Pins)

–0.30 V to DVIO +0.3 V

Ambient Temperature (Operating) 0

°C to +70°C

Storage Temperature

–65

°C to +150°C

ESD (electrostatic discharge) sensitive device.

Charged devices and circuit boards can discharge

without detection. Although this product features

patented or proprietary protection circuitry, damage

may occur on devices subjected to high energy ESD.

Therefore, proper ESD precautions should be taken to

avoid performance degradation or loss of functionality.

Package

Unit

LFCSP_VQ

°C/W

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