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STTH3R04RL Datasheet(PDF) 4 Page - STMicroelectronics |
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STTH3R04RL Datasheet(HTML) 4 Page - STMicroelectronics |
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4 / 10 page ![]() Characteristics STTH3R04 4/10 Figure 5. Relative variation of thermal impedance junction to ambient versus pulse duration, SMB (epoxy FR4, copper thickness = 35 µm) Figure 6. Relative variation of thermal impedance junction to ambient versus pulse duration, SMC 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.E-01 1.E+00 1.E+01 1.E+02 1.E+03 Z th(j-a)/Rth(j-a) Single pulse SMB SCu=1cm² tP(s) 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.E-01 1.E+00 1.E+01 1.E+02 1.E+03 Z th(j-a)/Rth(j-a) Single pulse SMC SCu=1cm² tP(s) Figure 7. Junction capacitance versus reverse voltage applied (typical values) Figure 8. Reverse recovery charges versus dIF/dt (typical values) 1 10 100 1 10 100 1000 C(pF) F=1MHz V OSC=30mVRMS T j=25°C VR(V) 0 10 20 30 40 50 60 70 80 90 100 10 100 1000 Q RR(nC) I F= 3 A V R=320 V T j=125 °C T j=25 °C dIF/dt(A/µs) Figure 9. Reverse recovery time versus dIF/dt (typical values) Figure 10. Peak reverse recovery current versus dIF/dt (typical values) 0 10 20 30 40 50 60 70 80 90 100 10 100 1000 t RR(ns) I F= 3 A V R=320 V T j=125 °C T j=25 °C dIF/dt(A/µs) 0 1 2 3 4 5 6 7 8 10 100 1000 I RM(A) I F= 3 A V R=320 V T j=125 °C T j=25 °C dIF/dt(A/µs) |
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