HD74LS375

Rev.2.00, Feb.18.2005, page 4 of 5

Testing Method

Test Circuit

G

DQ

Q

Q

Q

D

P.G.

Ω

G

P.G.

Ω

Notes:

1.

Test is put into the each latch.

2.

3.

All diodes are 1S2074(H).

Waveform

0V

3V

0V

3V

D

G

Q

Q

10%

90%

1.3 V

1.3 V

1.3 V

1.3 V

1.3 V

10%

90%

1.3 V

10%

90%

1

µs

1

µs

10%

500ns

90%

1.3 V

1.3 V

1.3 V

1.3 V

1.3 V

500ns

Notes:

1.

≤ 10 ns, t

TLH

≤ 10 ns.

2.

When measuring propagation delay times from the D input, the corresponding G input must be

held high.