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HM62V8512CLTS-7SL Datasheet(PDF) 14 Page - Renesas Technology Corp |
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HM62V8512CLTS-7SL Datasheet(HTML) 14 Page - Renesas Technology Corp |
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14 / 16 page ![]() HM62V8512CTS Series 12 Low V CC Data Retention Characteristics (Ta = –20 to +70°C) Parameter Symbol Min Typ Max Unit Test conditions* 3 V CC for data retention V DR 2— — V CS ≥ V CC – 0.2 V, Vin ≥ 0 V Data retention current I CCDR — 0.8* 4 20* 1 µAV CC = 3.0 V, Vin ≥ 0 V CS ≥ V CC – 0.2 V — 0.8* 4 10* 2 µA Chip deselect to data retention time t CDR 0 — — ns See retention waveform Operation recovery time t R t RC* 5 —— ns Notes: 1. For L-version and 10 µA (max.) at Ta = –20 to +40°C. 2. For L-SL-version and 3 µA (max.) at Ta = –20 to +40°C. 3. CS controls address buffer, WE buffer, OE buffer, and Din buffer. In data retention mode, Vin levels (address, WE, OE, I/O) can be in the high impedance state. 4. Typical values are at V CC = 3.0 V, Ta = +25°C and specified loading, and not guaranteed. 5. t RC = read cycle time. Low V CC Data Retention Timing Waveform (CS Controlled) CC V 2.7 V 2.0 V 0 V CS tCDR tR CS V – 0.2 V CC ≥ DR V Data retention mode |
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