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THBT7011DRL Datasheet(PDF) 5 Page - STMicroelectronics |
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THBT7011DRL Datasheet(HTML) 5 Page - STMicroelectronics |
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5 / 8 page  Pulse ( µs) Vp C1 C2 LR1 R2 R3 R4 IPP Rp tr tp (V) ( µF) (nF) ( µH) ( Ω)(Ω)(Ω)(Ω) (A) ( Ω) 10 700 1500 20 200 0 50 15 25 25 30 10 1.2 50 1500 1 33 0 76 13 25 25 30 10 2 10 2500 10 0 1.1 1.3 0 3 3 38 62 TEST CIRCUIT 3 for IPP and VBO parameters : CC R R TIP RING GND VP 4 3 2 R2 R1 L 1 (V is defined in no load condition) P TEST CIRCUIT 2 for IH parameter. R -VP VBAT = - 48 V Surge generator D.U.T. This is a GO-NOGO test which allows to confirm the holding current (IH) level in a functional test circuit. TEST PROCEDURE : 1) Adjust the current level at the IH value by short circuiting the AK of the D.U.T. 2) Fire the D.U.T with a surge Current : Ipp = 10A , 10/1000 µs. 3) The D.U.T will come back off-state within 50 ms max. THBT7011D 5/8 |
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