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TPS2552DBVT Datasheet(PDF) 16 Page - Texas Instruments |
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TPS2552DBVT Datasheet(HTML) 16 Page - Texas Instruments |
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16 / 26 page ![]() ACCOUNTING FOR RESISTOR TOLERANCE CONSTANT-CURRENT VS. LATCH-OFF OPERATION AND IMPACT ON OUTPUT VOLTAGE TPS2552 TPS2553, TPS2552-1, TPS2553-1 SLVS841A – NOVEMBER 2008 – REVISED DECEMBER 2008........................................................................................................................................ www.ti.com The previous sections described the selection of RILIM given certain application requirements and the importance of understanding the current-limit threshold tolerance. The analysis focussed only on the TPS2552/53 and TPS2552-1/53-1 performance and assumed an exact resistor value. However, resistors sold in quantity are not exact and are bounded by an upper and lower tolerance centered around a nominal resistance. The additional RILIM resistance tolerance directly affects the current-limit threshold accuracy at a system level. The following table shows a process that accounts for worst-case resistor tolerance assuming 1% resistor values. Step one follows the selection process outlined in the application examples above. Step two determines the upper and lower resistance bounds of the selected resistor. Step three uses the upper and lower resistor bounds in the IOS equations to calculate the threshold limits. It is important to use tighter tolerance resistors, e.g. 0.5% or 0.1%, when precision current limiting is desired. Table 1. Common RILIM Resistor Selections Resistor Tolerance Actual Limits Ideal Closest 1% Desired Nominal Resistor Resistor IOS MIN IOS Nom IOS MAX Current Limit (mA) 1% low (k Ω) 1% high (k Ω) (k Ω) (k Ω) (mA) (mA) (mA) 75 SHORT ILIM to IN 50.0 75.0 100.0 120 226.1 226 223.7 228.3 101.3 120.0 142.1 200 134.0 133 131.7 134.3 173.7 201.5 233.9 300 88.5 88.7 87.8 89.6 262.1 299.4 342.3 400 65.9 66.5 65.8 67.2 351.2 396.7 448.7 500 52.5 52.3 51.8 52.8 448.3 501.6 562.4 600 43.5 43.2 42.8 43.6 544.3 604.6 673.1 700 37.2 37.4 37.0 37.8 630.2 696.0 770.8 800 32.4 32.4 32.1 32.7 729.1 800.8 882.1 900 28.7 28.7 28.4 29.0 824.7 901.5 988.7 1000 25.8 26.1 25.8 26.4 908.3 989.1 1081.0 1100 23.4 23.2 23.0 23.4 1023.7 1109.7 1207.5 1200 21.4 21.5 21.3 21.7 1106.0 1195.4 1297.1 1300 19.7 19.6 19.4 19.8 1215.1 1308.5 1414.9 Both the constant-current devices (TPS2552/53) and latch-off devices (TPS2552-1/53-1) operate identically during normal operation, i.e. the load current is less than the current-limit threshold and the devices are not limiting current. During normal operation the N-channel MOSFET is fully enhanced, and VOUT = VIN - (IOUT x rDS(on)). The voltage drop across the MOSFET is relatively small compared to VIN, and VOUT ≈ VIN. Both the constant-current devices (TPS2552/53) and latch-off devices (TPS2552-1/53-1) operate identically during the initial onset of an overcurrent event. Both devices limit current to the programmed current-limit threshold set by RILIM by operating the N-channel MOSFET in the linear mode. During current-limit operation, the N-channel MOSFET is no longer fully-enhanced and the resistance of the device increases. This allows the device to effectively regulate the current to the current-limit threshold. The effect of increasing the resistance of the MOSFET is that the voltage drop across the device is no longer negligible (VIN ≠ VOUT), and VOUT decreases. The amount that VOUT decreases is proportional to the magnitude of the overload condition. The expected VOUT can be calculated by IOS × RLOAD, where IOS is the current-limit threshold and RLOAD is the magnitude of the overload condition. For example, if IOS is programmed to 1 A and a 1 Ω overload condition is applied, the resulting VOUT is 1 V. While both the constant-current devices (TPS2552/53) and latch-off devices (TPS2552-1/53-1) operate identically during the initial onset of an overcurrent event, they behave differently if the overcurrent event lasts longer than the internal delay "deglitch" circuit (7.5-ms typ). The constant-current devices (TPS2552/53) assert the FAULT flag after the deglitch period and continue to regulate the current to the current-limit threshold indefinitely. In practical circuits, the power dissipation in the package will increase the die temperature above the overtemperature shutdown threshold (135°C min), and the device will turn off until the die temperature decreases by the hysteresis of the thermal shutdown circuit (10°C typ). The device will turn on and continue to thermal cycle 16 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): TPS2552 TPS2553 TPS2552-1 TPS2553-1 |
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