Electronic Components Datasheet Search
  English  ▼

X  

MMBZ33VAL Datasheet(PDF) 10 Page - NXP Semiconductors

Part # MMBZ33VAL
Description  Double ESD protection diodes for transient overvoltage suppression
PDF  15 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

MMBZ33VAL Datasheet(HTML) 10 Page - NXP Semiconductors

Back Button MMBZ33VAL Datasheet HTML 6Page - NXP Semiconductors MMBZ33VAL Datasheet HTML 7Page - NXP Semiconductors MMBZ33VAL Datasheet HTML 8Page - NXP Semiconductors MMBZ33VAL Datasheet HTML 9Page - NXP Semiconductors MMBZ33VAL Datasheet HTML 10Page - NXP Semiconductors MMBZ33VAL Datasheet HTML 11Page - NXP Semiconductors MMBZ33VAL Datasheet HTML 12Page - NXP Semiconductors MMBZ33VAL Datasheet HTML 13Page - NXP Semiconductors MMBZ33VAL Datasheet HTML 14Page - NXP Semiconductors Next Button
Zoom Inzoom in Zoom Outzoom out
 10 / 15 page
background image
MMBZXVAL_SER_1
© NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 01 — 1 September 2008
10 of 15
NXP Semiconductors
MMBZxVAL series
Double ESD protection diodes for transient overvoltage suppression
Circuit board layout and protection device placement
Circuit board layout is critical for the suppression of ESD, Electrical Fast Transient (EFT)
and surge transients. The following guidelines are recommended:
1. Place the devices as close to the input terminal or connector as possible.
2. The path length between the device and the protected line should be minimized.
3. Keep parallel signal paths to a minimum.
4. Avoid running protected conductors in parallel with unprotected conductors.
5. Minimize all Printed-Circuit Board (PCB) conductive loops including power and
ground loops.
6. Minimize the length of the transient return path to ground.
7. Avoid using shared transient return paths to a common ground point.
8. Ground planes should be used whenever possible. For multilayer PCBs, use ground
vias.
9.
Test information
9.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard
Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in automotive applications.
10. Package outline
Fig 10. Package outline SOT23 (TO-236AB)
04-11-04
Dimensions in mm
0.45
0.15
1.9
1.1
0.9
3.0
2.8
2.5
2.1
1.4
1.2
0.48
0.38
0.15
0.09
12
3



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15


Datasheet Download

Go To PDF Page


Link URL



Does ALLDATASHEET help your business so far?  [ DONATE ] 

About Alldatasheet   |   Advertisement   |   Contact us   |   Privacy Policy   |   Link to Datasheet    |   Link Exchange   |   Manufacturer List
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com