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USBUF02W6 Datasheet(PDF) 7 Page - STMicroelectronics |
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USBUF02W6 Datasheet(HTML) 7 Page - STMicroelectronics |
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7 / 9 page ![]() USBUFxxW6 7/9 Vg 50 Ω 50 Ω TEST BOARD UUx Fig. A9: Analog crosstalk measurements 1 10 100 1,000 -100 -80 -60 -40 -20 0 Frequency (MHz) Analog crosstalk (dB) Fig. A10: Typical analog crosstalk results Figure A9 gives the measurement circuit for the analog crosstalk application. In figure A10, the curve shows the effect of the D+ cell on the D- cell. In usual frequency range of analog signals (up to 100MHz) the effect on disturbed line is less than -37dB. D+ D- VG1 VG1 +5V +5V 74HC04 +5V Square Pulse Generator 74HC04 β21 3.3 V Rp Ct Rt Ct Rt D1 Gnd D2 D4 D3 3.3 V Fig. A11: Digital crosstalk measurements configuration VG1 β21 G1 V Fig. A12: Digital crosstalk results Figure A11 shows the measurement circuit used to quantify the crosstalk effect in a classical digital appli- cation. Figure A12 shows, with a signal from 0 to 5V and rise time of few ns, the impact on the disturbed line is less than 250mV peak to peak. No data distur- bance was noted on the other line.The measure- ments performed with falling edges gives an impact within the same range. |
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