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WS57LV291C Datasheet(PDF) 2 Page - STMicroelectronics

Part # WS57LV291C
Description  HIGH SPEED 3.3 VOLT 2K x 8 CMOS PROM/RPROM
PDF  6 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

WS57LV291C Datasheet(HTML) 2 Page - STMicroelectronics

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AC READ CHARACTERISTICS Over Operating Range. (See Above)
PARAMETER
SYMBOL
WS57LV291C-70
WS57LV291C-90
UNITS
MIN
MAX
MIN
MAX
Address to Output Delay
tACC
70
90
CS to Output Delay
tCS
20
30
ns
Output Disable to Output Float
*
tDF
20
30
Address to Output Hold
tOH
00
WS57LV291C
2-16
DC READ CHARACTERISTICS Over Operating Range. (See Above)
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
MAX
UNITS
VIL
Input Low Voltage
(Note 3)
–0.1
0.6
V
VIH
Input High Voltage
(Note 3)
2.0
VCC + 0.3
V
VOL
Output Low Voltage
IOL = 16 mA
0.4
V
VOH
Output High Voltage
IOH = –4 mA
2.4
V
(Notes 1 and 2)
ICC
VCC Active Current (CMOS)
ICC at Maximum Frequency
25
mA
Outputs Not Loaded
ILI
Input Leakage Current
VIN = 3.6V or Gnd
–10
10
µA
ILO
Output Leakage Current
VOUT = 3.6 V or Gnd
–10
10
µA
OPERATING RANGE
RANGE
TEMPERATURE
VCC
Commercial
0°C to +70°C
+ 3.3V ± 0.3V
ABSOLUTE MAXIMUM RATINGS*
Storage Temperature............................–65° to + 150°C
Voltage on any Pin with
Respect to Ground ....................................–0.6V to +7V
VPP with Respect to Ground...................–0.6V to + 14V
ESD Protection ..................................................
>2000V
NOTES:
1. CMOS inputs: GND ± 0.3V or VCC ± 0.3V.
2. For TTL inputs add 5 mA ICC.
3. These are absolute voltages with respect to device ground pin and include all overshoots due to system and/or tester noise.
Do not attempt to test these values without suitable equipment.
*NOTICE:
Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to the device.
This is a stress rating only and functional operation of
the device at these or any other conditions above
those indicated in the operational sections of this
specification is not implied. Exposure to absolute
maximum rating conditions for extended periods of
time may affect device reliability.
*Sampled, Not 100% Tested.
MODE
PINS
CS1/
CS2
CS3
VCC
OUTPUTS
VPP
Read
VIL
VIH
VIH
VCC
DOUT
Output
Disable
V
IH
XX
V
CC
High Z
Output
XVIL
XVCC
High Z
Disable
Output
Disable
XX
V
IL
V
CC
High Z
Program
VPP
XX
VCC
DIN
Program
Verify
V
IL
V
IH
V
IH
V
CC
DOUT
MODE SELECTION



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