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RH07

ELECTRICAL CHARACTERISTICS

TABLE 1A:

(Post-Irradiation) (Note 6)

SYMBOL PARAMETER

CONDITIONS

NOTES MIN

MAX

MIN

MAX

MIN

MAX

MIN

MAX

MIN

MAX

UNITS

VOS

Input Offset Voltage

150

200

250

300

µV

IOS

Input Offset Current

2.8

Input Bias Current

±3

±10

±25

±50

±100

Input Voltage Range

±13.5

CMRR

Common-Mode

VCM = ±13V

110

105

100

Rejection Ratio

PSRR

Power Supply

VS = ±3V to ±18V

100

Rejection Ratio

AVOL

Large-Signal Voltage Gain

RL ≥ 2k, VO = ±10V

200

180

150

120

V/mV

VOUT

Maximum Output

RL ≥ 10k

±12.5

Voltage Swing

Slew Rate

RL ≥ 2k

0.1

0.075

0.05

µs

Power Dissipation

120

10KRAD(Si)

20KRAD(Si)

50KRAD(Si) 100KRAD(Si) 200KRAD(Si)

Note 1: Offset voltage is measured with high speed test equipment

approximately 0.5 seconds after power is applied.

Note 2: Long-term input offset voltage stability refers to the averaged

trend line of VOS vs. time over extended periods after the first 30 days of

operation. Excluding the initial hour of operation, changes in VOS during

the first 30 days are typically 2.5

µV.

Note 3: Parameter is guaranteed by design, characterization, or correlation

to other tested parameters.

Note 4: 10Hz noise voltage density is sample tested on every lot to an

LTPD of 15. Devices 100% tested at 10Hz are available on request.

Note 5: VS = ±15V, VCM = 0V, unless otherwise noted.

Note 6: TA = 25°C, VS = ±15V, VCM = 0V, unless otherwise noted.

TOTAL DOSE BIAS CURRE T

–

–15V

15V

10k

RH07 F01

10k

MIL-STD-883 TEST REQUIREMENTS

SUBGROUP

Final Electrical Test Requirements (Method 5004)

1*,2,3,4,5,6

Group A Test Requirements (Method 5005)

1,2,3,4,5,6

Group B and D for Class S, and

Group C and D for Class B

End Point Electrical Parameters (Method 5005)

* PDA Applies to subgroup 1. See PDA Test Notes.

TABLE 2: ELECTRICAL TEST REQUIRE E TS

PDA Test Notes

The PDA is specified as 5% based on failures from group A, subgroup 1,

tests after cooldown as the final electrical test in accordance with method

5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup

1, after burn-in divided by the total number of devices submitted for burn-

in in that lot shall be used to determine the percent for the lot.

Linear Technology Corporation reserves the right to test to tighter limits

than those given.

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