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TCL1117 Datasheet(PDF) 2 Page - TelCom Semiconductor, Inc

Part # TCL1117
Description  800mA LOW DROPOUT POSITIVE REGULATORS ADJUSTABLE AND FIXED 2.85V, 3.30V, 5.00V
PDF  9 Pages
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Manufacturer  TELCOM [TelCom Semiconductor, Inc]
Direct Link  http://www.telcom-semi.com
Logo TELCOM - TelCom Semiconductor, Inc

TCL1117 Datasheet(HTML) 2 Page - TelCom Semiconductor, Inc

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PRELIMINARY INFORMATION
TCL1117-05 6/5/97
TCL1117
TCL1117-2.85
TCL1117-3.30
TCL1117-5.00
800mA LOW DROPOUT POSITIVE REGULATORS
ADJUSTABLE AND FIXED 2.85V, 3.30V, 5.00V
ABSOLUTE MAXIMUM RATINGS*
Input Voltage
Operating Voltage:
TCL1117, TCL1117-3.30, TCL1117-5.00 ...... 15V
TCL1117-2.85 ................................................ 10V
Surge Voltage:
TCL1117, TCL1117-3.30, TCL1117-5.00 ...... 20V
Operating Junction Temperature ............... 0
°C to +125°C
ELECTRICAL CHARACTERISTICS
Symbol
Parameter
Test Conditions
Min
Typ
Max
Unit
Reference
TCL1117
IOUT = 10mA, (VIN – VOUT) = 2V, TJ = 25°C
1.238 1.250 1.262
V
Voltage
10
≤ IOUT ≤ 800mA, 1.4V ≤ (VIN – VOUT) ≤ 10V (Note 1) 1.225 1.250 1.270
Output Voltage
TCL1117-2.85
IOUT = 10mA, VIN = 4.85V, TJ = 25°C
2.820 2.850 2.880
V
0
≤ IOUT ≤ 800mA, 4.25V ≤ VIN ≤ 10V (Note 1)
2.790 2.850 2.910
0
≤ IOUT ≤ 500mA, VIN = 3.95V (Note 1)
2.790 2.850 2.910
TCL1117-3.30
IOUT = 10mA, VIN = 5.3V, TJ = 25°C
3.265 3.300 3.335
V
0
≤ IOUT ≤ 800mA, 4.75V ≤ VIN ≤ 10V (Note 1)
3.230 3.300 3.370
TCL1117-5.00
IOUT = 10mA, VIN = 7V, TJ = 25°C
4.950 5.000 5.050
V
0
≤ IOUT ≤ 800mA, 6.50V ≤ VIN ≤ 12V (Note 1)
4.900 5.000 5.100
Line Regulation
TCL1117
IOUT = 10mA, 1.5V ≤ VIN – VOUT ≤ 15V (Notes 1 & 2)
—
0.035
0.2
%
TCL1117-2.85
IOUT = 0mA, 4.25V ≤ VIN ≤ 10V (Notes 1 & 2)
—
1
6
mV
TCL1117-3.30
IOUT = 0mA, 4.75V ≤ VIN ≤ 15V (Notes 1 & 2)
—
1
7
TCL1117-5.00
IOUT = 0mA, 6.5V ≤ VIN ≤ 15V (Notes 1 & 2)
—
1
10
Load Regulation
TCL1117
(VIN – VOUT) = 3V, 10mA, ≤ IOUT ≤ 800mA (Notes 1 & 2)
—
0.1
0.4
%
TCL1117-2.85
VIN = 4.25V, 0 ≤ IOUT ≤ 800mA (Notes 1 & 2)
—
1
10
mV
TCL1117-3.30
VIN = 4.75V, 0 ≤ IOUT ≤ 800mA (Notes 1 & 2)
—
1
12
TCL1117-5.00
VIN = 6.5V, 0 ≤ IOUT ≤ 800mA (Notes 1 & 2)
—
1
15
Dropout Voltage
IOUT = 100mA, (Note 1 & 3)
—
1.00
1.10
V
IOUT = 500mA, (Note 1 & 3)
—
1.05
1.15
IOUT = 800mA, (Note 1 & 3)
—
1.10
1.20
Current Limit
(VIN – VOUT) = 5V, TJ = 25°C
800
950
1200
mA
Minimum Load
TCL1117
(VIN – VOUT) = 15V (Note 1 & 4)
—
1.7
5
mA
Current
Quiescent
TCL1117-2.85
VIN ≤ 10V (Note 1)
—
5
10
mA
Current
TCL1117-3.30
VIN ≤ 15V (Note 1)
—
5
10
TCL1117-5.00
VIN ≤ 15V (Note 1)
—
5
10
Thermal Regulation
TA = 25°C, 30msec Pulse
—
0.01
0.1
%W
Ripple Rejection
fRIPPLE = 120Hz (VIN – VOUT) = 3V, VRIPPLE = 1Vp-p ( Note 1)
60
75
—
dB
Adjust Pin Current
(Note 1)
—
55
120
µA
Adjust Pin Current Change
10mA
≤ IOUT ≤ 800mA, 1.4V ≤ (VIN – VOUT) ≤ 10V (Note 1)
—
0.2
5
µA
Temperature Stability
—
0.5
—
%
Long Term Stability
TA = 125°C, 1000 Hrs.
—
0.3
—
%
RMS Output Noise
(% of VOUT), 10Hz ≤ f ≤ 10kHz
—
0.003
—
%
Thermal Resistance
(Junction to Case, at Tab)
—
15
—
°C/W
NOTES: 1. Specifications apply over the full operating temperature range.
2. See thermal regulation specification for changes in output voltage due to heating effects. Load regulation and line regulation are
measured at a constant junction temperature by low duty cycle pulse testing.
3. Dropout voltage is specified over the full output current range of the device. Dropout voltage is defined as the minimum input/output
differential measured at the specified output current. Test points and limits are also shown on the Dropout Voltage curve.
4. Minimum load current is defined as the minimum output current required to maintain regulation.
Storage Temperature ............................ – 65
°C to +150°C
Lead Temperature (Soldering 10 sec) .................... 300
°C
*Stresses beyond those listed under "Absolute Maximum Ratings" may
cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not
implied. Exposure to absolute maximum rating conditions for extended
periods may affect device reliability.



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