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LTC1050CS8 Datasheet(PDF) 6 Page - Linear Technology |
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LTC1050CS8 Datasheet(HTML) 6 Page - Linear Technology |
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6 / 16 page ![]() 6 LTC1050 1050fb S APPLICATI IFOR ATIO ACHIEVING PICOAMPERE/MICROVOLT PERFORMANCE Picoamperes In order to realize the picoampere level of accuracy of the LTC1050, proper care must be exercised. Leakage currents in circuitry external to the amplifier can significantly degrade performance. High quality insulation should be used (e.g., Teflon, Kel-F); cleaning of all insulating surfaces to remove fluxes and other residues will probably be necessary— particularly for high temperature performance. Surface coating may be necessary to provide a moisture barrier in high humidity environments. Board leakage can be minimized by encircling the input connections with a guard ring operated at a potential close to that of the inputs: in inverting configurations the guard ring should be tied to ground; in noninverting connections to the inverting input (see Figure 1). Guarding both sides of the printed circuit board is required. Bulk leakage reduc- tion depends on the guard ring width. Microvolts Thermocouple effect must be considered if the LTC1050’s ultralow drift is to be fully utilized. Any connection of dis- similar metals forms a thermoelectric junction producing an electric potential which varies with temperature (Seebeck effect). As temperature sensors, thermocouples exploit this phenomenon to produce useful information. In low drift amplifier circuits the effect is a primary source of error. Connectors, switches, relay contacts, sockets, resistors, solder and even copper wire are all candidates for thermal TEST CIRCUITS – + LTC1050 OUTPUT 1050 TC01 V+ 1k 1M 6 7 2 3 4 RL V – – + LTC1050 – + LT ®1012 1050 TC02 10Ω 100k 158k 316k 475k 475k 0.015µF FOR 1Hz NOISE BW, INCREASE ALL THE CAPACITORS BY A FACTOR OF10 0.015µF 0.015µF TO X-Y RECORDER Electrical Characteristics Test Circuit DC-10Hz Noise Test Circuit EMF generation. Junctions of copper wire from different manufacturers can generate thermal EMFs of 200nV/°C— 4 times the maximum drift specification of the LTC1050. The copper/kovar junction, formed when wire or printed circuit traces contact a package lead, has a thermal EMF of approximately 35µV/°C—700 times the maximum drift specification of the LTC1050. Minimizing thermal EMF-induced errors is possible if ju- dicious attention is given to circuit board layout and component selection. It is good practice to minimize the number of junctions in the amplifier’s input signal path. Avoid connectors, sockets, switches and relays where possible. In instances where this is not possible, attempt to balance the number and type of junctions so that differ- ential cancellation occurs. Doing this may involve deliberately introducing junctions to offset unavoidable junctions. 8 1 7 V + V – 6 OUTPUT 1050 F01 5 OPTIONAL EXTERNAL CLOCK 4 GUARD 2 3 Figure 1 |
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