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LTC1458LCSW Datasheet(PDF) 8 Page - Linear Technology |
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LTC1458LCSW Datasheet(HTML) 8 Page - Linear Technology |
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8 / 12 page ![]() 8 LTC1458/LTC1458L Serial Interface The data on the DIN input is loaded into the shift register on the rising edge of the clock. Data is loaded as one 48-bit word, DAC A first, then DAC B, DAC C and DAC D. The MSB is loaded first for each DAC. The DAC registers load the data from the shift register when CS/LD is pulled high. The CLK is disabled internally when CS/LD is high. Note: CLK must be low before CS/LD is pulled low to avoid an extra internal clock pulse. The buffered output of the 48-bit shift register is available on the DOUT pin which swings from ground to VCC. Multiple LTC1458/LTC1458Ls may be daisy-chained to- gether by connecting the DOUT pin to the DIN pin of the next chip, while the CLK and CS/LD signals remain common to all chips in the daisy-chain. The serial data is clocked to all of the chips, then the CS/LD signal is pulled high to update all of them simultaneously. Reference The LTC1458L has an internal reference of 1.22V with a full scale of 2.5V (gain of 2 configuration). The LTC1458 includes an internal 2.048V reference, making 1LSB equal to 1mV (gain of 2 configuration). When the buffer gain is 2, the external reference must be less than VCC/2 and be capable of driving the 15k minimum DAC resistor ladder. The external reference must always be less than VCC – 1.5V. The reference output voltage noise spectral density at 1kHz is 300nV/ √Hz. Voltage Output The rail-to-rail buffered output of the LTC1458 family can source or sink 5mA when operating with a 5V supply over the entire operating temperature range while pulling to within 300mV of the positive supply voltage or ground. The output swings to within a few millivolts of either supply rail when unloaded and has an equivalent output resistance of 40 Ω when driving a load to the rails. The output can drive 1000pF without going into oscillation. The output voltage noise spectral density at 1kHz is 600nV/ √Hz. Differential Nonlinearity (DNL): DNL is the difference between the measured change and the ideal 1LSB change between any two adjacent codes. The DNL error between any two codes is calculated as follows: DNL = ( ∆VOUT – LSB)/LSB ∆VOUT = The measured voltage difference between two adjacent codes Digital Feedthrough: The glitch that appears at the analog output caused by AC coupling from the digital inputs when they change state. The area of the glitch is specified in (nV)(sec). DEFI ITIO S OPERATIO |
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