CY74FCT16823CTPVC datasheet(3/8 Pages) TI

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CY74FCT16823T

CY74FCT162823T

Electrical Characteristics Over the Operating Range

Parameter

Description

Test Conditions

Min.

Typ.[5]

Max.

Unit

VIH

Input HIGH Voltage

2.0

VIL

Input LOW Voltage

0.8

Input Hysteresis[6]

100

VIK

Input Clamp Diode Voltage

VCC=Min., IIN=−18 mA

−0.7

−1.2

IIH

Input HIGH Current

VCC=Max., VI=VCC

±1

µA

IIL

Input LOW Current

VCC=Max., VI=GND

±1

µA

IOZH

High Impedance Output Current

(Three-State Output pins)

VCC=Max., VOUT=2.7V

±1

µA

IOZL

High Impedance Output Current

(Three-State Output pins)

VCC=Max., VOUT=0.5V

±1

µA

IOS

Short Circuit Current[7]

VCC=Max., VOUT=GND

−80

−140

−200

Output Drive Current[7]

VCC=Max., VOUT=2.5V

−50

−180

IOFF

Power-Off Disable

VCC=0V, VOUT≤4.5V

[8]

µA

Output Drive Characteristics for CY74FCT16823T

Parameter

Description

Test Conditions

Min.

Typ.[5]

Max.

Unit

VOH

Output HIGH Voltage

VCC=Min., IOH=−3 mA

2.5

3.5

VCC=Min., IOH=−15 mA

2.4

3.5

VCC=Min., IOH=−32 mA

2.0

3.0

VOL

Output LOW Voltage

VCC=Min., IOL=64 mA

0.2

0.55

Output Drive Characteristics for CY74FCT162823T

Parameter

Description

Test Conditions

Min.

Typ.[5]

Max.

Unit

IODL

Output LOW Voltage[7]

VCC=5V, VIN=VIH or VIL, VOUT=1.5V

115

150

IODH

Output HIGH Voltage[7]

VCC=5V, VIN=VIH or VIL, VOUT=1.5V

−60

−115

−150

VOH

Output HIGH Voltage

VCC=Min., IOH=−24 mA

2.4

3.3

VOL

Output LOW Voltage

VCC=Min., IOL=24 mA

0.3

0.55

Capacitance[9] (TA = +25˚C, f = 1.0 MHz)

Parameter

Description

Test Conditions

Typ.[5]

Max.

Unit

CIN

Input Capacitance

VIN = 0V

4.5

6.0

COUT

Output Capacitance

VOUT = 0V

5.5

8.0

Notes:

Typical values are at VCC= 5.0V, TA= +25˚C ambient.

This input is speciﬁed but not tested.

Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample

and hold techniques are preferable in order to minimize internal chip heating and more accurately reﬂect operational values. Otherwise prolonged shorting

of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter

tests, IOS tests should be performed last.

Tested at +25˚C.

This parameter is speciﬁed but not tested.

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