SN54AC14, SN74AC14

HEX SCHMITT-TRIGGER INVERTERS

SCAS522D – AUGUST 1995 – REVISED FEBRUARY 1998

1

POST OFFICE BOX 655303

CMOS) Submicron Process

Small-Outline (D), Shrink Small-Outline

(DB), and Thin Shrink Small-Outline (PW)

Packages, Ceramic Chip Carriers (FK) and

Flatpacks (W), and Standard Plastic (N) and

Ceramic (J) DIPS

description

The ’AC14 devices contain six independent

inverters. The devices perform the Boolean

function Y = A.

The SN54AC14 is characterized for operation

over the full military temperature range of –55

°C

to 125

°C. The SN74AC14 is characterized for

operation from –40

°C to 85°C.

FUNCTION TABLE

(each inverter)

INPUT

OUTPUT

INPUT

A

OUTPUT

Y

H

L

L

H

1

1A

3

2A

5

3A

9

4A

11

5A

13

6A

1Y

2

3Y

6

2Y

4

4Y

8

6Y

12

5Y

10

† This symbol is in accordance with ANSI/IEEE Std 91-1984 and

IEC Publication 617-12.

Pin numbers shown are for the D, DB, J, N, PW, or W packages.

logic diagram, each inverter (positive logic)

AY

Copyright

© 1998, Texas Instruments Incorporated

EPIC is a trademark of Texas Instruments Incorporated.

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

1

2

3

4

5

6

7

14

13

12

11

10

9

8

1A

1Y

2A

2Y

3A

3Y

GND

6A

6Y

5A

5Y

4A

4Y

32

1 20 19

910 11 12 13

4

5

6

7

8

18

17

16

15

14

6Y

NC

5A

NC

5Y

2A

NC

2Y

NC

3A

SN54AC14 . . . FK PACKAGE

(TOP VIEW)

NC – No internal connection

SN54AC14 ...J OR W PACKAGE

SN74AC14 . . . D, DB, N, OR PW PACKAGE

(TOP VIEW)

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

On products compliant to MIL-PRF-38535, all parameters are tested

unless otherwise noted. On all other products, production

processing does not necessarily include testing of all parameters.