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SN74AS760 Datasheet(PDF) 1 Page - Texas Instruments

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Part # SN74AS760
Description  OCTAL BUFFERS AND LINE DRIVERS WITH OPEN-COLLECTOR OUTPUTS
PDF  6 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

SN74AS760 Datasheet(HTML) 1 Page - Texas Instruments

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SN54AS760, SN74ALS760, SN74AS760
OCTAL BUFFERS AND LINE DRIVERS
WITH OPEN-COLLECTOR OUTPUTS
SDAS141A – DECEMBER 1983 – REVISED JANUARY 1995
Copyright
© 1995, Texas Instruments Incorporated
1
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
• Open-Collector Outputs Drive Bus Lines or
Buffer Memory Address Registers
• Eliminates the Need for 3-State Overlap
Protection
• pnp Inputs Reduce dc Loading
• Open-Collector Versions of ′ALS244 and
′AS244
• Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic (N)
and Ceramic (J) 300-mil DIPs
description
These octal buffers and line drivers are designed
specifically to improve both the performance and
density of 3-state memory address drivers, clock
drivers,
and
bus-oriented
receivers
and
transmitters by eliminating the need for 3-state
overlap
protection.
With
the
′AS756 and
SN74AS757, these devices provide the choice of
selected
combinations
of
inverting
outputs,
symmetrical
active-low
output-enable
(OE)
inputs, and complementary OE and OE inputs.
The SN54AS760 is characterized for operation
over the full military temperature range of – 55
°C
to 125
°C. The SN74ALS760 and SN74AS760 are
characterized for operation from 0
°C to 70°C.
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
1OE
1A1
2Y4
1A2
2Y3
1A3
2Y2
1A4
2Y1
GND
VCC
2OE
1Y1
2A4
1Y2
2A3
1Y3
2A2
1Y4
2A1
SN54AS760 ...J PACKAGE
SN74ALS760, SN74AS760 . . . DW OR N PACKAGE
(TOP VIEW)
3
2
1 20 19
910 11 12 13
4
5
6
7
8
18
17
16
15
14
1Y1
2A4
1Y2
2A3
1Y3
1A2
2Y3
1A3
2Y2
1A4
SN54AS760 . . . FK PACKAGE
(TOP VIEW)
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.


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