TLC5615C, TLC5615I

10-BIT DIGITAL-TO-ANALOG CONVERTERS

SLAS142C – OCTOBER 1996 – REVISED MARCH 2000

2

POST OFFICE BOX 655303

functional block diagram

_

+

DAC

10-Bit DAC Register

Power-ON

Reset

Control

Logic

16-Bit Shift Register

4

Dummy

Bits

2

0s

10 Data Bits

(LSB)

(MSB)

REFIN

AGND

CS

SCLK

DIN

OUT

(Voltage Output)

_

+

DOUT

RR

2

Terminal Functions

TERMINAL

I/O

DESCRIPTION

NAME

NO.

I/O

DESCRIPTION

DIN

1

I

Serial data input

SCLK

2

I

Serial clock input

CS

3

I

Chip select, active low

DOUT

4

O

Serial data output for daisy chaining

AGND

5

Analog ground

REFIN

6

I

Reference input

OUT

7

O

DAC analog voltage output

VDD

8

Positive power supply

7 V

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Digital input voltage range to AGND

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Reference input voltage range to AGND

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Output voltage at OUT from external source

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Continuous current at any terminal

±20 mA

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

0

°C to 70°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

TLC5615I

– 40

°C to 85°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

–65

°C to 150°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds

260

°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and

functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not

implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.