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ADN2872ACPZ-R7 Datasheet(PDF) 4 Page - Analog Devices |
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ADN2872ACPZ-R7 Datasheet(HTML) 4 Page - Analog Devices |
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4 / 20 page ![]() ADN2872 Rev. 0 | Page 4 of 20 Parameter Min Typ Max Unit Conditions/Comments SUPPLY ICC7 30 mA When IBIAS = IMOD = 0 VCC (with respect to GND)8 3.0 3.3 3.6 V 1 Temperature range: −40°C to +85°C. 2 Measured into a 15 Ω load (22 Ω resistor in parallel with digital scope 50 Ω input) using a 11110000 pattern at 2.5 Gbps, shown in Figure 2. 3 Guaranteed by design and characterization. Not production tested. 4 When the voltage on DATAP is greater than the voltage on DATAN, the modulation current flows into the IMODP pin. 5 Guaranteed by design. Not production tested. 6 IBIAS/IBMON ratio stability is defined in SFF-8472 Revision 9 over temperature and supply variation. 7 See the Power Consumption section for ICC minimum for power calculation. 8 All VCC pins should be shorted together. ADN2872 IMODP BIAS TEE 80kHz → 27GHz VCC VCC TO HIGH SPEED DIGITAL OSCILLOSCOPE 50 Ω INPUT R 22 Ω C L Figure 2. High Speed Electrical Test Output Circuit SFP TIMING SPECIFICATIONS Table 2. Parameter Symbol Min Typ Max Unit Conditions/Comments ALS Assert Time t_off 1 5 μs Time for the rising edge of ALS (Tx_DISABLE) to when the bias current falls below 10% of nominal ALS Negate Time1 t_on 0.83 0.95 ms Time for the falling edge of ALS to when the modulation current rises above 90% of nominal Time to Initialize, Including Reset of FAIL1 t_init 25 275 ms From power-on or negation of FAIL using ALS FAIL Assert Time t_fault 100 μs Time to fault to FAIL on ALS to Reset Time t_reset 5 μs Time Tx_DISABLE must be held high to reset Tx_FAULT 1 Guaranteed by design and characterization. Not production tested. DATAP DATAN DATAP – DATAN Vp-p, DIFF = 2 × VSE VSE 0V Figure 3. Signal Level Definition 0.1µF 0.1µF 10µF 1µH 3.3V SFP HOST BOARD SFP MODULE VCC_Tx Figure 4. Recommended SFP Supply |
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