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MB39C007 Datasheet(PDF) 13 Page - fujitsu semiconductor |
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MB39C007 Datasheet(HTML) 13 Page - fujitsu semiconductor |
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13 / 52 page ![]() MB39C007 DS04-27246-2E 13 ■ TEST CIRCUIT FOR MEASURING TYPICAL OPERATING CHARACTERISTICS Note : These components are recommended based on the operating tests authorized. TDK : TDK Corporation SSM : SUSUMU Co., Ltd KOA : KOA Corporation Component Specification Vendor Part Number Remarks R1 1 M Ω KOA RK73G1JTTD D 1 M Ω R3-1 R3-2 20 k Ω 150 k Ω SSM SSM RR0816-203-D RR0816-154-D VOUT1/VOUT2 = 2.5 V Setting R4 300 k Ω SSM RR0816-304-D R5 510 k Ω KOA RK73G1JTTD D 510 k Ω R6 100 k Ω SSM RR0816-104-D C1 4.7 μF TDK C2012JB1A475K C2 4.7 μF TDK C2012JB1A475K C3 0.1 μF TDK C1608JB1E104K C6 0.1 μF TDK C1608JB1H104K For adjusting slow start time L1 2.2 μH TDK VLF4012AT-2R2M VIN VOUT1/ VOUT2 L1 2.2 µH C1 4.7µF IOUT C2 4.7 µF CTL1/CTL2 MODE1/MODE2 VREF VREFIN1/VREFIN2 AGND OUT1/OUT2 AVDD LX1/LX2 DVDD1/DVDD2 GND R1 1 M Ω VDD VDD MB39C007 DGND1/DGND2 VDET R4 300 k Ω R5 510 k Ω R6 100 k Ω C6 0.1 µF SW C3 0.1 µF R3-1 20 k Ω R3-2 150 k Ω SW VOUT = 2.97 × VREFIN |
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