5075 datasheet(11/14 Pages) NPC

11 / 14 page

5075 series

SEIKO NPC CORPORATION —11

Drive Level

Measurement circuit

Negative Resistance

Measurement circuit

Note. "C0" value is set, concerning the actual crystal characteristics connected between XT and XTN. The data is measured with Agilent 4396B using

NPC’s original measurement jig. The values may vary with measurement jig and conditions.

VDD = 2.5V, 3.3V, fOUT = 27MHz, Ta = R.T.

0.0 0.3 0.6 0.9 1.2

1.5 1.8 2.1 2.4 2.7 3.0 3.3

VC [V]

VDD = 2.5V

VDD = 3.3V

DL = (IX’tal)

2 × Re

DL: drive level

IX’tal: current ﬂowing to crystal (RMS value)

Re: crystal effective resistance

VDD

VSS

Crystal

XTN

0.1

µF

CLOUT = 15pF

Tektronix CT-6

Current Probe

IX'tal

VDD = 2.5V, C0 = 2pF, Ta = R.T.

Frequency [MHz]

VC = 1.25V

VC = 2.5V

VC = 0V

−200

−400

−600

−800

VDD = 3.3V, C0 = 2pF, Ta = R.T.

Frequency [MHz]

−200

−400

−600

−800

VC = 1.65V

VC = 3.3V

VC = 0V

VDD

VSS

XTN

0.1

µF

C0 = 2pF

Network Analyzer

(Agilent 4396B)

S-Parameter Test Set

(Agilent 85046A)

5075 Datasheet(PDF) 11 Page - Nippon Precision Circuits Inc

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