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5076 Datasheet(PDF) 11 Page - Nippon Precision Circuits Inc |
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5076 Datasheet(HTML) 11 Page - Nippon Precision Circuits Inc |
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11 / 13 page ![]() 5076 series SEIKO NPC CORPORATION —11 Negative Resistance Measurement circuit Note. "C0" value is set, concerning the actual crystal characteristics connected between XT and XTN. The data is measured with Agilent 4396B using NPC’s original measurement jig. The values may vary with measurement jig and conditions. Phase Noise Measurement circuit VDD = 1.8V, C0 = 2pF, Ta = R.T. Frequency [MHz] 15 20 25 30 35 40 45 −200 −400 −600 −800 0 VC = 0V VC = 0.9V VC = 1.8V VDD VSS XT Q XTN VC 0.1 µF C0 = 2pF Network Analyzer (Agilent 4396B) S-Parameter Test Set (Agilent 85046A) VDD = 1.8V, fOUT = 27MHz, Ta = R.T. Offset Frequency [Hz] 10 100 1,000 10,000 100,000 1,000,000 10,000,000 −60 −80 −100 −120 −140 −160 VC = 1.8V VC = 0.9V VC = 0V CLOUT = 15pF 0.1 µF VDD VSS XT Q XTN VC Signal Source Analyzer (Agilent E5052A) Crystal 0.01 µF 200 Ω |
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