Production Data

WM2639

WOLFSON MICROELECTRONICS LTD

Production Data Rev 1.0 July 1999

3

ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at

or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical

Characteristics at the test conditions specified

ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible

to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage

of this device.

CONDITION

MIN

MAX

Digital supply voltages, VDD to GND

7V

Reference input voltage

-0.3V

VDD + 0.3V

Digital input voltage range to GND

-0.3V

VDD + 0.3V

WM2639CDT

WM2639IDT

0

°C

-40

°C

70

°C

85

°C

Storage temperature

-65

°C

150

°C

Lead temperature 1.6mm (1/16 inch) soldering for 10 seconds

260

°C

RECOMMENDED OPERATING CONDITIONS

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Supply voltage

VDD

2.7

5.5

V

High-level digital input voltage

VDD = 2.7V to 5.5V

2

V

Low-level digital input voltage

VDD = 2.7V to 5.5V

0.8

V

Reference voltage to REF

See Note

VDD - 1.5

V

Load resistance

2

k

Ω

Load capacitance

100

pF

WM2639CDT

0

70

°C

Operating free-air temperature

WM2639IDT

-40

85

°C

Note: Reference voltages greater than VDD/2 will cause output saturation for large DAC codes.