Symbol

Parameter

Conditions

Min

(Note 6)

Typ

(Note 5)

Max

(Note 6)

Units

I

TEST

Fault Detection: Test Current

Setting 1 (CUR[2:0] = 001b), V

2.25V

10

nA

Setting 2 (CUR[2:0] = 010b), V

2.25V

100

nA

Setting 3 (CUR[2:0] = 011b), V

2.25V

1

µA

Setting 4 (CUR[2:0] = 100b), V

2.25V

10

µA

Setting 5 (CUR[2:0] = 101b), V

2.25V

100

µA

Electrical Characteristics (Serial Interface)

Unless otherwise specified, all limits guaranteed for T

(VHSER/VLPAR) − (VLSER/VHPAR)

Symbol

Parameter

Conditions

Min

(Note 6)

Typ

(Note 5)

Max

(Note 6)

Units

V

IL

Input Logic Low Threshold

0.3 × V

D

V

V

IH

Input Logic High Threshold

0.7 × V

D

V

V

OL

Output Logic Low Threshold

I

0.2

V

V

OH

Output Logic High Threshold

I

V

I

SDO

Output Source Current, SDO

V

CSB = 0V, V

−2

mA

Output Sink Current, SDO

V

CSB = 0V, V

2

I

OZ

Output Tri-state Leakage Current,

SDO

V

CSB = V

±1

µA

t

1

High Period, SCK

(Note 9)

100

ns

t

2

Low Period, SCK

(Note 9)

100

ns

t

3

Set Up Time, CSB to SCK

(Note 9)

50

ns

t

4

Set Up Time, SDI to SCK

(Note 9)

30

ns

t

5

Hold Time, SCK to SDI

(Note 9)

10

ns

t

6

Prop. Delay, SCK to SDO

(Note 9)

60

ns

t

7

Hold Time, SCK Transition to CSB

Rising Edge

(Note 9)

50

ns

t

8

CSB Inactive

(Note 9)

50

ns

t

9

Prop. Delay, CSB to SDO Active

(Note 9)

50

ns

t

10

Prop. Delay, CSB to SDO Inactive (Note 9)

50

ns

t

11

Hold Time, SCK Transition to CSB

Falling Edge

(Note 9)

10

ns

t

Signal Rise and Fall Times

(Note 9)

1.5

5

ns

Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is

intended to be functional, but for which specific performance is not guaranteed. For guaranteed specifications and the test conditions, see Electrical Characteristics.

Note 2: Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22–A115–A (ESD MM std. of JEDEC). Field-

Induced Charge-Device Model, applicable std. JESD22–C101–C (ESD FICDM std. of JEDEC).

Note 3: The short circuit test is a momentary test which applies to both single-supply and split-supply operation. Continuous short circuit operation at elevated

ambient temperature can exceed the maximum allowable junction temperature of 150°C.

Note 4: The maximum power dissipation is a function of T

P

Note 5: Typical Values indicate the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will

also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production material.

Note 6: All limits are guaranteed by testing or statistical analysis.

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