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RE46C165SW16F Datasheet(PDF) 14 Page - Microchip Technology |
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RE46C165SW16F Datasheet(HTML) 14 Page - Microchip Technology |
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14 / 30 page ![]() RE46C165/6/7/8 DS22251A-page 14 2010 Microchip Technology Inc. 3.6 Low Battery Detection In standby, an internal reference is compared to the voltage divided VDD supply. A low battery status is latched at the conclusion of the LED pulse. The horn will chirp once for 10 ms every 43 seconds, until the low battery condition no longer exists. The low battery chirp occurs next to the LED pulse. The low battery notification does not sound in a local or remote alarm condition. 3.7 Chamber Fail Detection In standby, a chamber test is also performed every 43 seconds, by switching to the high gain capacitor C1 and sensing the photo chamber background reflections. Two consecutive chamber test failures will cause the horn to chirp 3 times for 10 ms spaced 323 ms apart. This will repeat every 42 seconds, as long as a chamber test fail exists. The failed chamber test chirps occur ~21 seconds after the LED pulse in Standby mode (not hush). The chamber fail notification does not sound in a local or remote alarm condition. 3.8 Timer Mode If resistors RADJ1 and RADJ2 (see Typical Application figure) are in place and a high-to-low transition occurs on the TEST input, the device enters a timer mode (10 minutes maximum for RE46C165/6 devices, 1 minute maximum for RE46C167/8). In this mode, the smoke comparator reference is switched from the internal VDD – 3.5V reference to the voltage that appears on VSEN. This allows the sensitivity to be modified for the duration of the timer period. High gain operations (push-to-test and chamber test) always use the internal VDD – 3.5V reference. The chamber test is performed in Timer mode. If VSEN is left unconnected or tied to VSS, the Hush Timer mode operation is inhibited. If the smoke level causes the reduced sensitivity set point to be exceeded during this timer period, the unit will go into a local alarm condition, the horn will sound, and the Timer mode is cancelled. If an external only alarm occurs during the Timer mode, the Timer mode is cancelled. If the test button is pushed in a standby, reduced sensitivity mode, the unit is tested normally. Upon release of the test button, the 10 minute maximum timer mode counter is reset and restarted. 3.9 Alarm Memory If a detector has entered a local alarm, when exiting that local alarm, the alarm memory latch is set. Initially the LED can be used to visually identify any unit that had previously been in a local alarm condition. The LED will flash 3 times spaced 1.3 seconds apart. This pattern will repeat every 43 seconds. The duration of the flash is 10 ms. In order to conserve battery power, this visual indication will stop after a period of 24 hours. The user will always be able to identify a unit with an active alarm memory by pressing the push-to-test button. When this button is active, the horn will chirp and the LED will pulse on for 10 ms every 250 ms. The push-to-test alarm will not activate until the alarm memory is reset. If the alarm memory condition is set, any time the push- to-test button is pressed and then released, the alarm memory latch is reset. The initial 24 hour visual indication is not displayed if a low battery condition exits. 3.10 Diagnostic Mode In addition to the normal function of the TEST input, a special diagnostic mode is available to calibrate and test the smoke detector. Taking the TEST pin below VSS and sourcing ~200 µA out of the pin for 1 clock cycle will enable the diagnostic mode. In the diagnostic mode, some of the pin functions are redefined. Refer to Table 3-1 below for redefined pin functions in the diagnostic mode. In addition, in this mode STROBE is always enabled, and the IRED is pulsed at the clock rate of 10 ms nominal. |
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