SD2932

Test circuit 175 MHz

Doc ID 6876 Rev 8

11/22

C22,C23

0.1

µF / 500 V surface mount ceramic chip capacitor

C26,C27

0.01

µF / 500 V surface mount ceramic chip capacitor

C28

10

µF / 63 aluminum eletrolytic axial lead capacitor

B1

50 Ohm RG316 O.D 0.076[1.93] L = 11.80[299.72] flexible coaxial cable 4 Turns thru

Fair-rite Bead

B2

50 Ohm RG-142B O.D 0.165[4.19] L = 11.80[299.72] flexible coaxial cable

T1

R.F. Transformer 4:1, 25 Ohm O.D RG316-25 O.D 0.080[2.03] L = 5.90[149.86] flexible

coaxial cable 2 turns thru fair-rite multi-aperture core

T2

R.F. transformer 1:4, 25 Ohm semi-rigid coaxial cable O.D. 0.141[3.58] L = 5.90[149.86]

L1

Inductor

λ 1/4 Wave 50 Ohm O.D 0.165[4.19] L = 11.80 [299.72] flexible coaxial cable 2

turns thru fair-rite bead

FB1,FB5

Shield bead

FB2,FB6

Multi-aperture core

FB3

Multilayer ferrite chip bead (surface mount)

FB4

Surface mount emi shield bead

PCB

Woven Glass Reinforced PTFE Microwave Laminate 0.06”, 1 oz EDCu, Both sides,

εr =

2.55

Table 8.

175 MHz test circuit component part list (continued)

Component

Description