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74LVC2G66GD Datasheet(PDF) 15 Page - NXP Semiconductors |
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74LVC2G66GD Datasheet(HTML) 15 Page - NXP Semiconductors |
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15 / 26 page  74LVC2G66 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 5 — 16 June 2010 15 of 26 NXP Semiconductors 74LVC2G66 Bilateral switch 11.3 Test circuits Test conditions: VCC = 1.65 V: Vi = 1.4 V (p-p). VCC = 2.3 V: Vi = 2 V (p-p). VCC = 3 V: Vi = 2.5 V (p-p). VCC = 4.5 V: Vi = 4 V (p-p). Fig 20. Test circuit for measuring total harmonic distortion 001aag492 VIH VO VCC 0.5VCC nZ/nY nY/nZ nE 600 Ω fi RL 10 μF CL D Adjust fi voltage to obtain 0 dBm level at output. Increase fi frequency until dB meter reads −3dB. Fig 21. Test circuit for measuring the frequency response when switch is in ON-state 001aag491 VIH VO VCC 0.5VCC nZ/nY nY/nZ nE 50 Ω fi RL 0.1 μF CL dB Adjust fi voltage to obtain 0 dBm level at input. Fig 22. Test circuit for measuring isolation (OFF-state) 001aag493 VIL VO VCC 0.5VCC nZ/nY nY/nZ nE 50 Ω fi RL 0.5VCC RL 0.1 μF CL dB |
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