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BUF12840 Datasheet(PDF) 1 Page - Texas Instruments |
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BUF12840 Datasheet(HTML) 1 Page - Texas Instruments |
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1 / 8 page ![]() BUF12840 www.ti.com SBOS536 – OCTOBER 2010 Programmable Gamma-Voltage Generator with Integrated Two-Bank Memory and External EEPROM 1 FEATURES DESCRIPTION 2 • 10-BIT RESOLUTION The BUF12840 offers 12 programmable gamma channels with external electrically erasable • 12-CHANNEL P-GAMMA programmable read-only memory (EEPROM) read • READS FROM EXTERNAL EEPROM capabilities. • TWO INDEPENDENT PIN-SELECTABLE The BUF12840 has two separate memory banks that MEMORY BANKS allow simultaneous storage of two different gamma • RAIL-TO-RAIL OUTPUT: curves to facilitate switching between gamma curves. – 300mV Min Swing-to-Rail (10mA) All gamma channels offer a rail-to-rail output that – 200mV Min Swing-to-Rail (5mA) typically swings to within 200mV of either supply rail • LOW SUPPLY CURRENT with a 5mA load. All channels are programmed using a two-wire interface that supports standard operations • SUPPLY VOLTAGE: 9V to 20V up to 400kHz and high-speed data transfers up to • DIGITAL SUPPLY: 2V to 5.5V 3.4MHz. • TWO-WIRE INTERFACE: Supports 400kHz and The BUF12840 is manufactured using Texas 3.4MHz Operation Instruments’ proprietary, state-of-the-art, high-voltage CMOS process. This process offers very dense logic APPLICATIONS and high supply voltage operation of up to 20V. The • TFT-LCD REFERENCE DRIVERS BUF12840 is offered in a QFN-24 package, and is specified from –40°C to +95°C. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 2 All trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Copyright © 2010, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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