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AD9653 Datasheet(PDF) 26 Page - Analog Devices |
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AD9653 Datasheet(HTML) 26 Page - Analog Devices |
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26 / 40 page ![]() AD9653 Data Sheet Rev. 0 | Page 26 of 40 Figure 65. Differential LVDS Sample Clock (Up to 1 GHz) Figure 66. Single-Ended 1.8 V CMOS Input Clock (Up to 200 MHz) Input Clock Divider The AD9653 contains an input clock divider with the ability to divide the input clock by integer values between 1 and 8. The AD9653 clock divider can be synchronized using the external SYNC input. Bit 0 and Bit 1 of Register 0x109 allow the clock divider to be resynchronized on every SYNC signal or only on the first SYNC signal after the register is written. A valid SYNC causes the clock divider to reset to its initial state. This synchronization feature allows multiple parts to have their clock dividers aligned to guarantee simultaneous input sampling. Clock Duty Cycle Typical high speed ADCs use both clock edges to generate a vari- ety of internal timing signals and, as a result, may be sensitive to clock duty cycle. Commonly, a ±5% tolerance is required on the clock duty cycle to maintain dynamic performance characteristics. The AD9653 contains a duty cycle stabilizer (DCS) that retimes the nonsampling (falling) edge, providing an internal clock signal with a nominal 50% duty cycle. This feature minimizes performance degradation in cases where the clock input duty cycle deviates from 50% greater than the specified ±5%. Noise and distortion performance are nearly flat for a wider range of duty cycles with the DCS on, as shown in Figure 67 and Figure 68. Figure 67. SNR vs. DCS On/Off, VREF = 1.0 V Figure 68. SNR vs. DCS On/Off, VREF = 1.3 V Jitter in the rising edge of the input is still of concern and is not easily reduced by the internal stabilization circuit. The duty cycle control loop does not function for clock rates less than 20 MHz, nominally. The loop has a time constant associated with it that must be considered in applications in which the clock rate can change dynamically. A wait time of 1.5 µs to 5 µs is required after a dynamic clock frequency increase or decrease before the DCS loop is relocked to the input signal. Jitter Considerations High speed, high resolution ADCs are sensitive to the quality of the clock input. The degradation in SNR at a given input frequency (fA) due only to aperture jitter (tJ) can be calculated by SNR Degradation = 20 log10 × × J A t f π 2 1 In this equation, the rms aperture jitter represents the root mean square of all jitter sources, including the clock input, analog input signal, and ADC aperture jitter specifications. IF undersampling applications are particularly sensitive to jitter (see Figure 69). The clock input should be treated as an analog signal in cases where aperture jitter may affect the dynamic range of the AD9653. Power supplies for clock drivers should be separated from the 10 0Ω 0.1µF 0.1µF 0.1µF 0.1µF 50kΩ 50kΩ CLK– CLK+ ADC CLOCK INPUT CLOCK INPUT AD951x LVDS DRIVER OPTIONAL 100Ω 0.1µF 0.1µF 0.1µF 50Ω1 1 50Ω RESISTOR IS OPTIONAL. CLK– CLK+ ADC VCC 1kΩ 1kΩ CLOCK INPUT AD951x CMOS DRIVER 84 70 40 60 55 50 45 DUTY CYCLE (%) 72 74 76 78 80 82 SNRFS (DCS OFF) SNRFS (DCS ON) 84 70 40 60 55 50 45 DUTY CYCLE (%) 72 74 76 78 80 82 SNRFS (DCS OFF) SNRFS (DCS ON) |
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