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TNETE100PM Datasheet(PDF) 17 Page - Texas Instruments |
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TNETE100PM Datasheet(HTML) 17 Page - Texas Instruments |
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17 / 27 page ![]() ThunderLAN ™ TNETE100PM PCI ETHERNET ™ CONTROLLER WITH POWER MANAGEMENT SINGLE-CHIP 10 BASE-T WITH MII FOR 100 BASE-T/100VG-AnyLAN SPWS026 – OCTOBER 1996 17 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251–1443 test measurement The test-load circuit shown in Figure 3 represents the programmable load of the tester pin electronics that are used to verify timing parameters of the TNETE100PM output signals. (c) FIREF TEST CIRCUIT (b) AXMTP AND AXMTN TEST LOAD (ac TESTING) X1 – Fil – Mag 23Z90 (1:1) (a) TTL OUTPUT TEST LOAD 180 Ω FIREF AXMTN AXMTP 78 Ω Point Test CL IOH VLOAD IOL Point Test Test Under Output TTL 50 Ω FXMTN FXMTP X1 50 Ω 50 Ω Point Test 50 Ω X2 50 Ω 50 Ω 25 Ω 25 Ω FXMTN FXMTP Point Test 50 Ω 50 Ω 50 Ω 50 Ω Point Test (e) FXMTP AND FXMTN TEST LOAD (dc TESTING) (d) FXMTP AND FXMTN TEST LOAD (ac TESTING) X2 – Fil – Mag 23Z128 (1: √2) Where: IOL = Refer to IOL in recommended operating conditions IOH = Refer to IOH in recommended operating conditions VLOAD = 1.5 V, typical dc-level verification or 0.7 V, typical timing verification CL = 18 pF, typical load-circuit capacitance Figure 3. Test and Load Circuit |
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