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AD9645 Datasheet(PDF) 6 Page - Analog Devices

Part # AD9645
Description  Dual, 14-Bit, 80 MSPS/125 MSPS, Serial LVDS
PDF  36 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

AD9645 Datasheet(HTML) 6 Page - Analog Devices

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AD9645
Data Sheet
Rev. 0 | Page 6 of 36
SWITCHING SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −1.0 dBFS, unless otherwise noted.
Table 4.
Parameter1, 2
Temp
Min
Typ
Max
Unit
CLOCK3
Input Clock Rate
Full
10
1000
MHz
Conversion Rate
Full
10
80/125
MSPS
Clock Pulse Width High (t
EH)
Full
6.25/4.00
ns
Clock Pulse Width Low (t
EL)
Full
6.25/4.00
ns
OUTPUT PARAMETERS3
Propagation Delay (t
PD)
Full
2.3
ns
Rise Time (t
R) (20% to 80%)
Full
300
ps
Fall Time (t
F) (20% to 80%)
Full
300
ps
FCO Propagation Delay (t
FCO)
Full
1.5
2.3
3.1
ns
DCO Propagation Delay (t
CPD)
4
Full
t
FCO + (tSAMPLE/16)
ns
DCO to Data Delay (t
DATA)
4
Full
(t
SAMPLE/16) − 300
t
SAMPLE/16
(t
SAMPLE/16) + 300
ps
DCO to FCO Delay (t
FRAME)
4
Full
(t
SAMPLE/16) − 300
t
SAMPLE/16
(t
SAMPLE/16) + 300
ps
Lane Delay (t
LD)
90
ps
Data-to-Data Skew (t
DATA-MAX − tDATA-MIN)
Full
±50
±200
ps
Wake-Up Time (Standby)
25°C
250
ns
Wake-Up Time (Power-Down)5
25°C
375
μs
Pipeline Latency
Full
16
Clock
cycles
APERTURE
Aperture Delay (t
A)
25°C
1
ns
Aperture Uncertainty (Jitter, t
J)
25°C
174
fs rms
Out-of-Range Recovery Time
25°C
1
Clock
cycles
1 See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2 Measured on standard FR-4 material.
3 Can be adjusted via the SPI. The conversion rate is the clock rate after the divider.
4 t
SAMPLE/16 is based on the number of bits in two LVDS data lanes. tSAMPLE = 1/fS.
5 Wake-up time is defined as the time required to return to normal operation from power-down mode.
TIMING SPECIFICATIONS
Table 5.
Parameter
Description
Limit
Unit
SPI TIMING REQUIREMENTS
See Figure 68
t
DS
Setup time between the data and the rising edge of SCLK
2
ns min
t
DH
Hold time between the data and the rising edge of SCLK
2
ns min
t
CLK
Period of the SCLK
40
ns min
t
S
Setup time between CSB and SCLK
2
ns min
t
H
Hold time between CSB and SCLK
2
ns min
t
HIGH
SCLK pulse width high
10
ns min
t
LOW
SCLK pulse width low
10
ns min
t
EN_SDIO
Time required for the SDIO pin to switch from an input to an output relative
to the SCLK falling edge (not shown in Figure 68)
10
ns min
t
DIS_SDIO
Time required for the SDIO pin to switch from an output to an input relative
to the SCLK rising edge (not shown in Figure 68)
10
ns min



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