AD677

REV. A

–5–

WARNING!

ESD SENSITIVE DEVICE

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily

accumulate on the human body and test equipment and can discharge without detection.

Although the AD677 features proprietary ESD protection circuitry, permanent damage may

occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD

precautions are recommended to avoid performance degradation or loss of functionality.

ORDERING GUIDE

Temperature

Package

Model

Range

S/(N+D)

Max INL

Package Description

Option*

AD677JN

0

°C to +70°C

89 dB

Typ Only

Plastic 16-Pin DIP

N-16

AD677KN

0

°C to +70°C

90 dB

±1.5 LSB

Plastic 16-Pin DIP

N-16

AD677JD

0

°C to +70°C

89 dB

Typ Only

Ceramic 16-Pin DIP

D-16

AD677KD

0

°C to +70°C

90 dB

±1.5 LSB

Ceramic 16-Pin DIP

D-16

AD677JR

0

°C to +70°C

89 dB

Typ Only

Plastic 28-Lead SOIC

R-28

AD677KR

0

°C to +70°C

90 dB

±1.5 LSB

Plastic 28-Lead SOIC

R-28

AD677AD

–40

°C to +85°C

89 dB

Typ Only

Ceramic 16-Pin DIP

D-16

AD677BD

–40

°C to +85°C

90 dB

±1.5 LSB

Ceramic 16-Pin DIP

D-16

*D = Ceramic DIP; N = Plastic DIP; R = Small Outline IC (SOIC).

ABSOLUTE MAXIMUM RATINGS*

Vcc to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +18 V

VEE to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . –18 V to +0.3 V

AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V

Digiul Inputs to DGND . . . . . . . . . . . . . . . . . . . . . . 0 to +5.5 V

Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +300

°C, 10 sec

Storage Temperature . . . . . . . . . . . . . . . . . . . . . –65

°C to +150°C

*Stresses greater than those listed under “Absolute Maximum Ratings” may cause

permanent damage to the device. This is a stress rating only and functional

operation of the device at these or any other conditions above those indicated in the

operational section of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.