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AD684 Datasheet(PDF) 7 Page - Analog Devices |
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AD684 Datasheet(HTML) 7 Page - Analog Devices |
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7 / 8 page ![]() AD684 REV. A –7– The AD684 does not provide separate analog and digital ground leads as is the case with most A-to-D converters. The common pin is the single ground terminal for the device. It is the refer- ence point for the sampled input voltage and the held output voltage and also the digital ground return path. The common pin should be connected to the reference (analog) ground of the A-to-D converter with a separate ground lead. Since the analog and digital grounds in the 684 are connected internally, the common pin should also be connected to the digital ground, which is usually tied to analog common at the A-to-D converter. Figure 4 illustrates the recommended decoupling and grounding practice. NOISE CHARACTERISTICS Designers of data conversion circuits must also consider the effect of noise sources on the accuracy for the data acquisition system. A sample-and-hold amplifier that precedes the A-to-D converter introduces some noise and represents another source of uncertainty in the conversion process. The noise from the AD684 is specified as the total output noise, which includes both the sampled wideband noise of the SHA in addition to the band limited output noise. The total output noise is the rms sum of the sampled dc uncertainty and the hold mode noise. A plot of the total output noise vs. the equivalent input bandwidth of the converter being used is given in Figure 5. Figure 5. RMS Noise vs. Input Bandwidth of ADC DRIVING THE ANALOG INPUTS For best performance, it is important to drive the AD684 analog inputs from a low impedance signal source. This enhances the sampling accuracy by minimizing the analog and digital crosstalk. Signals which come from higher impedance sources (e.g., over 5k ohms) will have a relatively higher level of crosstalk. For applications where signals have high source impedance, an operational amplifier buffer in front of the AD684 is required. The AD713 (precision quad BiFET op amp) is recommended for these applications. HIGH FREQUENCY SAMPLING Aperture jitter and distortion are the primary factors which limit frequency domain performance of a sample-and-hold amplifier. Aperture jitter modulates the phase of the hold command and produces an effective noise on the sampled analog input. The magnitude of the jitter induced noise is directly related to the frequency of the input signal. A graph showing the magnitude of the jitter induced error vs. frequency of the input signal is given in Figure 6. The accuracy in sampling high frequency signals is also con- strained by the distortion and noise created by the sample-and- hold. The level of distortion increases with frequency and reduces the “effective number of bits” of the conversion. Measurements of Figures 7 and 8 were made using a 14-bit A-to-D converter with VIN = 10 V p-p and a sample frequency of 100 kSPS. Figure 6. Error Magnitude vs. Frequency Figure 7. Total Harmonic Distortion vs. Frequency Figure 8. Signal/(Noise and Distortion) vs. Frequency |
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