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AD797BN Datasheet(PDF) 9 Page - Analog Devices |
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AD797BN Datasheet(HTML) 9 Page - Analog Devices |
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9 / 16 page ![]() AD797 REV. C –9– NOISE AND SOURCE IMPEDANCE CONSIDERATIONS The AD797’s ultralow voltage noise of 0.9 nV/ √Hz is achieved with special input transistors running at nearly 1 mA of collector current. It is important then to consider the total input referred noise (eNtotal), which includes contributions from voltage noise (eN), current noise (iN), and resistor noise (√4 kTrS). eNtotal = [eN 2 + 4 kTr S + 4 (iNrS) 2]l/2 Equation 1 where rS = total input source resistance. This equation is plotted for the AD797 in Figure 30. Since opti- mum dc performance is obtained with matched source resis- tances, this case is considered even though it is clear from Equation 1 that eliminating the balancing source resistance will lower the total noise by reducing the total rS by a factor of two. At very low source resistance (rS <50 Ω), the amplifiers’ voltage noise dominates. As source resistance increases the Johnson noise of rS dominates until at higher resistances (rS >2 kΩ) the current noise component is larger than the resistor noise. 100 1 0.1 10 10 100 1000 10000 SOURCE RESISTANCE – Ω TOTAL NOISE RESISTOR NOISE ONLY Figure 30. Noise vs. Source Resistance The AD797 is the optimum choice for low noise performance provided the source resistance is kept <1 k Ω. At higher values of source resistance, optimum performance with respect to noise alone is obtained with other amplifiers from Analog Devices (see Table I). Table I. Recommended Amplifiers for Different Source Impedances rS, ohms Recommended Amplifier 0 to <1 k AD797 1 k to <10 k AD707, AD743/AD745, OP27/OP37, OP07 10 k to <100 k AD705, AD743/AD745, OP07 >100 k AD548, AD549, AD645, AD711, AD743/ AD745 LOW FREQUENCY NOISE Analog Devices specifies low frequency noise as a peak to peak (p-p) quantity in a 0.1 Hz to 10 Hz bandwidth. Several tech- niques can be used to make this measurement. The usual tech- nique involves amplifying, filtering, and measuring the amplifiers noise for a predetermined test time. The noise bandwidth of the filter is corrected for and the test time is carefully controlled since the measurement time acts as an additional low frequency roll-off. The plot in Figure 4 was made using a slightly different tech- nique. Here an FFT based instrument (Figure 31) is used to generate a 10 Hz “brickwall” filter. A low frequency pole at 0.1 Hz is generated with an external ac coupling capacitor, the instrument being dc coupled. Several precautions are necessary to get optimum low frequency noise performance: 1. Care must be used to account for the effects of rS, even a 10 Ω resistor has 0.4 nV/√Hz of noise (an error of 9% when root sum squared with 0.9 nV/ √Hz). 2. The test set up must be fully warmed up to prevent eOS drift from erroneously contributing to input noise. 3. Circuitry must be shielded from air currents. Heat flow out of the package through its leads creates the opportunity for a thermoelectric potential at every junction of different metals. Selective heating and cooling of these by random air currents will appear as 1/f noise and obscure the true device noise. 4. The results must be interpreted using valid statistical techniques. 100k Ω 1.5 µF 1 Ω HP 3465 DYNAMIC SIGNAL ANALYZER (10Hz) VOUT ** USE POWER SUPPLY BYPASSING SHOWN IN FIGURE 32. AD797 ** 2 7 3 4 6 ** –VS +VS Figure 31. Test Setup for Measuring 0.1 Hz to 10 Hz Noise WIDEBAND NOISE The AD797, due to its single stage design, has the property that its noise is flat over frequencies from less than 10 Hz to beyond 1 MHz. This is not true of most dc precision amplifiers where second stage noise contributes to input referred noise beyond the audio frequency range. The AD797 offers new levels of per- formance in wideband imaging applications. In sampled data systems, where aliasing of out of band noise into the signal band is a problem, the AD797 will out perform all previously avail- able IC op amps. |
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