ADM206E/ADM207E/ADM208E/ADM211E/ADM213E

REV. B

–11–

R1

R2

C1

DEVICE

UNDER TEST

HIGH

VOLTAGE

GENERATOR

ESD TEST METHOD

R2

C1

H. BODY MIL-STD883B

1.5k

100pF

IEC1000-4-2

330

150pF

Figure 25. ESD Test Standards

100

90

36.8

10

TIME t

Figure 26. Human Body Model ESD Current Waveform

100

90

10

TIME t

30ns

60ns

0.1 TO 1ns

Figure 27. IEC1000-4-2 ESD Current Waveform

The ADM2xxE family of products are tested using both the

above mentioned test methods. All pins are tested with respect

to all other pins as per the MIL-STD-883B specification. In

addition all I-O pins are tested as per the IEC test specification.

The products were tested under the following conditions:

(a) Power-On—Normal Operation

(b) Power-On—Shutdown Mode

(c) Power-Off

There are four levels of compliance defined by IEC1000-4-2.

The ADM2xxE family of products meet the most stringent

compliance level for both contact and for air-gap discharge. This

means that the products are able to withstand contact discharges in

excess of 8 kV and air-gap discharges in excess of 15 kV.

Table IV. IEC1000-4-2 Compliance Levels

Contact Discharge

Air Discharge

Level

kV

kV

12

2

24

4

36

8

48

15

Table V. ADM2xxE ESD Test Results

ESD Test Method

I-O Pins

Other Pins

MIL-STD-883B

±15 kV

±2.5 kV

IEC1000-4-2

Contact

±8 kV

Air

±15 kV

FAST TRANSIENT BURST TESTING (IEC1000-4-4)

IEC1000-4-4 (previously 801-4) covers electrical fast-transient/

burst (EFT) immunity. Electrical fast transients occur as a

result of arcing contacts in switches and relays. The tests simu-

late the interference generated when for example a power relay

disconnects an inductive load. A spark is generated due to the

well known back EMF effect. In fact the spark consists of a

burst of sparks as the relay contacts separate. The voltage appear-

ing on the line, therefore, consists of a bust of extremely fast tran-

sient impulses. A similar effect occurs when switching on

fluorescent lights.

The fast transient burst test defined in IEC1000-4-4 simulates

this arcing and its waveform is illustrated in Figure 28. It con-

sists of a burst of 2.5 kHz to 5 kHz transients repeating at

300 ms intervals. It is specified for both power and data lines.

300ms

15ms

t

V

5ns

0.2/0.4ms

50ns

V

t

Figure 28. IEC1000-4-4 Fast Transient Waveform