TSH253

High Sensitivity Omni-Polar Hall Effect Switch

1/8

Version: C13

TO-92S

SOT-23

Description

TSH253 Hall-effect sensor is a temperature stable, stress-resistant switch. Superior high-temperature

performance is made possible through a dynamic offset cancellation that utilizes chopper-stabilization. This

method reduces the offset voltage normally caused by device over molding, temperature dependencies, and

thermal stress. TSH253 includes the following on a single silicon chip: voltage regulator, Hall voltage generator,

small-signal amplifier, chopper stabilization, Schmitt trigger, open-drain output. Advanced CMOS wafer fabrication

processing is used to take advantage of low-voltage requirements, component matching, very low input-offset

errors, and small component geometries.

Features

●

CMOS Hall IC Technology

●

Solid-State Reliability much better than reed switch

●

Omni polar output switches with absolute value of

North or South pole from magnet

●

Operation down to 1.8 V and Max at 6V.

●

High Sensitivity for reed switch replacement

●

ESD HBM ±4KV Min

Ordering Information

Part No.

Package

Packing

TSH253CT B0G

TO-92S

1Kpcs / Bulk Bag

TSH253CX RFG

SOT-23

3Kpcs / 7” Reel

Note: “G” denote for Halogen Free Product

Application

●

Solid state switch, Revolution counter

●

Lid close sensor for power supply devices

●

Magnet proximity sensor for reed switch

replacement in high duty cycle applications.

●

Safety Key on sporting equipment

●

Speed sensor, Position Sensor, Rotation Sensor

Characteristics

Limit

Value

Unit

Supply voltage

6

V

Output Voltage

6

V

Reverse voltage

-0.3

V

Magnetic flux density

Unlimited

Gauss

Output current

1

mA

Operating Temperature Range

-40 to +85

Storage temperature range

-55 to +150

Maximum Junction Temp

150

Thermal Resistance - Junction to Ambient

TO-92S

θ

JA

206

SOT-23

543

Thermal Resistance - Junction to Case

TO-92S

θ

JC

148

SOT-23

410

Package Power Dissipation

TO-92S

606

mW

SOT-23

230

Note: Exceeding the absolute maximum ratings may cause permanent damage. Exposure to absolute maximum-

rated conditions for extended periods may affect device reliability.

Pin Definition:

2. GND

3. Output

Pin Definition:

2. Output

3. GND