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LMP2234AMA/NOPB Datasheet(PDF) 7 Page - Texas Instruments |
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LMP2234AMA/NOPB Datasheet(HTML) 7 Page - Texas Instruments |
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7 / 31 page  LMP2234 www.ti.com SNOSAW4D – SEPTEMBER 2007 – REVISED MARCH 2013 1.8V DC Electrical Characteristics (1) Unless otherwise specified, all limits are ensured for TA = 25°C, V + = 1.8V, V− = 0V, V CM = VO = V +/2, and R L > 1 MΩ. Boldface limits apply at the temperature extremes. Symbol Parameter Conditions Min Typ Max Units (2) (3) (2) VOS Input Offset Voltage ±10 ±230 μV ±325 TCVOS Input Offset Voltage Drift LMP2234A ±0.3 ±0.75 μV/°C LMP2234B ±0.3 ±2.5 IBIAS Input Bias Current ±0.02 ±1.0 pA ±50 IOS Input Offset Current ±5 fA CMRR Common Mode Rejection Ratio 0V ≤ VCM ≤ 0.8V 76 92 dB 75 PSRR Power Supply Rejection Ratio 1.6V ≤ V+ ≤ 5.5V 83 120 dB VCM = 0V 82 CMVR Common Mode Voltage Range CMRR ≥ 76 dB -0.2 1.0 V CMRR ≥ 75 dB 0 1.0 AVOL Large Signal Voltage Gain VO = 0.3V to 1.5V 103 120 dB RL = 10 kΩ to V +/2 103 VO Output Swing High RL = 10 kΩ to V +/2 12 50 mV VIN(diff) = 100 mV 50 from either rail Output Swing Low RL = 10 kΩ to V +/2 13 50 VIN(diff) = −100 mV 50 IO Output Current (4) Sourcing, VO to V − 2.5 5 mA VIN(diff) = 100 mV 2 Sinking, VO to V + 2 5 VIN(diff) = −100 mV 1.5 IS Supply Current 31 42 µA 44 (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the device may be permanently degraded, either mechanically or electrically. (2) All limits are specified by testing, statistical analysis or design. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production material. (4) The short circuit test is a momentary open loop test. Copyright © 2007–2013, Texas Instruments Incorporated Submit Documentation Feedback 7 Product Folder Links: LMP2234 |
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