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DAC7568 Datasheet(PDF) 49 Page - Texas Instruments |
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DAC7568 Datasheet(HTML) 49 Page - Texas Instruments |
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49 / 65 page ![]() V = HYST ´ 10 (ppm/ C) ° 6 |V V | - REF_PRE REF_POST V REF_NOM OutputPin Meter Load ForceLine SenseLine Contactand TraceResistance I L V OUT DAC7568 DAC8168 DAC8568 www.ti.com SBAS430D – JANUARY 2009 – REVISED MAY 2012 Load Regulation Thermal Hysteresis Load regulation is defined as the change in reference Thermal hysteresis for a reference is defined as the output voltage as a result of changes in load current. change in output voltage after operating the device at The load regulation of the internal reference is +25°C, cycling the device through the operating measured using force and sense contacts as shown temperature range, and returning to +25°C. in Figure 126. The force and sense lines reduce the Hysteresis is expressed by Equation 3: impact of contact and trace resistance, resulting in accurate measurement of the load regulation contributed solely by the internal reference. Measurement results are summarized in the Typical (3) Characteristics. Force and sense lines should be Where: used for applications that require improved load VHYST = thermal hysteresis. regulation. VREF_PRE = output voltage measured at +25°C pre-temperature cycling. VREF_POST = output voltage measured after the device cycles through the temperature range of –40°C to +125°C, and returns to +25°C. DAC NOISE PERFORMANCE Typical noise performance for the DAC7568, DAC8168, and DAC8568 with the internal reference enabled is shown in Figure 66 to Figure 67. Output noise spectral density at the VOUT pin versus frequency is depicted in Figure 66 for full-scale, Figure 126. Accurate Load Regulation of the midscale, and zero-scale input codes. The typical DAC7568/DAC8168/DAC8568 Internal Reference noise density for midscale code is 120nV/ √Hz at 1kHz and 100nV/ √Hz at 1MHz. High-frequency noise can be improved by filtering the reference noise. Long-Term Stability Integrated output noise between 0.1Hz and 10Hz is Long-term stability/aging refers to the change of the close to 6 μVPP (midscale), as shown in Figure 67. output voltage of a reference over a period of months or years. This effect lessens as time progresses (see Figure 7, the typical long-term stability curve). The typical drift value for the internal reference is 50ppm from 0 hours to 1900 hours. This parameter is characterized by powering-up 20 units and measuring them at regular intervals for a period of 1900 hours. Copyright © 2009–2012, Texas Instruments Incorporated Submit Documentation Feedback 49 Product Folder Link(s): DAC7568 DAC8168 DAC8568 |
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