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CALVC164245IGQLREP Datasheet(PDF) 13 Page - Texas Instruments |
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CALVC164245IGQLREP Datasheet(HTML) 13 Page - Texas Instruments |
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13 / 19 page ![]() www.ti.com Tj − Continuous – °C 0 2 4 6 8 10 12 14 120 125 130 135 140 145 150 155 160 Electromigration Fail Mode Wirebond Voiding Fail Mode SN74ALVC164245-EP 16-BIT 2.5-V TO 3.3-V/3.3-V TO 5-V LEVEL-SHIFTING TRANSCEIVER WITH 3-STATE OUTPUTS SCAS774A – JUNE 2004 – REVISED SEPTEMBER 2005 74ALVC164245MDGG*EP Estimated Device Life at Elevated Temperatures Electromigration and Wirebond Voiding Fail Modes A. Silicon operating life design goal is 10 years at 105 °C junction temperature. 13 |
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